Kychin Hwang

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1994

2 Chauchin Su, Kychin Hwang, Shyh-Jye Jou: An I_DDQ Based Built-in Concurrent Test Technique for Interconnects in a Boundary-Scan Environment. ITC 1994: 670-676

1993

1 Chauchin Su, Kychin Hwang: A Serial-Scan Test-Vector-Compression Methodology. ITC 1993: 981-988

	1994
2		Chauchin Su, Kychin Hwang, Shyh-Jye Jou: An I_DDQ Based Built-in Concurrent Test Technique for Interconnects in a Boundary-Scan Environment. ITC 1994: 670-676
	1993
1		Chauchin Su, Kychin Hwang: A Serial-Scan Test-Vector-Compression Methodology. ITC 1993: 981-988

Coauthor Index

1 Shyh-Jye Jou [2]

2 Chauchin Su [1] [2]

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