Yong Min Hur

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2004

1 Il-soo Lee, Yong Min Hur, Tony Ambler: The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time. Asian Test Symposium 2004: 94-97

	2004
1		Il-soo Lee, Yong Min Hur, Tony Ambler: The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time. Asian Test Symposium 2004: 94-97

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