Ming-Hsiung Hung

	2006
1		Tung-Ho Lin, Ming-Hsiung Hung, Rung-Chuan Lin, Fan-Tien Cheng: A Virtual Metrology Scheme for Predicting CVD Thickness in Semiconductor Manufacturing. ICRA 2006: 1054-1059

Coauthor Index

1	Fan-Tien Cheng	[1]
2	Rung-Chuan Lin	[1]
3	Tung-Ho Lin	[1]

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