P. Huguet

	2001
1		B. Lambert, N. Malbert, Nathalie Labat, F. Verdier, André Touboul, P. Huguet, R. Bonnet, G. Pataut: Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses. Microelectronics Reliability 41(9-10): 1573-1578 (2001)

Coauthor Index

1	R. Bonnet	[1]
2	Nathalie Labat	[1]
3	B. Lambert	[1]
4	N. Malbert	[1]
5	G. Pataut	[1]
6	André Touboul	[1]
7	F. Verdier	[1]

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