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| 2005 | ||
|---|---|---|
| 1 | Simon A. Rushworth, L. M. Smith, Andrew J. Kingsley, Rajesh Odedra, R. Nickson, P. Hughes: Vapour pressure measurement of low volatility precursors. Microelectronics Reliability 45(5-6): 1000-1002 (2005) | |
| 1 | Andrew J. Kingsley | [1] |
| 2 | R. Nickson | [1] |
| 3 | Rajesh Odedra | [1] |
| 4 | Simon A. Rushworth | [1] |
| 5 | L. M. Smith | [1] |
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