 | 2009 |
| 6 |  | E. Miranda,
J. Martin-Martinez,
E. O'Connor,
G. Hughes,
P. Casey,
K. Cherkaoui,
S. Monaghan,
R. Long,
D. O'Connell,
P. K. Hurley:
Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks.
Microelectronics Reliability 49(9-11): 1052-1055 (2009) |
| 2007 |
| 5 |  | P. K. Hurley,
K. Cherkaoui,
S. McDonnell,
G. Hughes,
A. W. Groenland:
Characterisation and passivation of interface defects in (1 0 0)-Si/SiO2/HfO2/TiN gate stacks.
Microelectronics Reliability 47(8): 1195-1201 (2007) |
| 2000 |
| 4 |  | G. Hughes:
Non-splitting Abelian (4 t, 2, 4 t, 2 t) Relative Difference Sets and Hadamard Cocycles.
Eur. J. Comb. 21(3): 323-331 (2000) |
| 1990 |
| 3 |  | G. Hughes:
Computer crime: the liability of hackers.
Australian Computer Journal 22(2): 47-50 (1990) |
| 1974 |
| 2 |  | H. C. A. Hankins,
H. L. Mason,
R. N. Procter,
G. Hughes:
A Low Cost Computer Graphics Storage Terminal with Selective Erasure.
IFIP Congress 1974: 81-84 |
| 1971 |
| 1 |  | H. C. A. Hankins,
G. Hughes:
The Impact of Dark Trace Displays on Computer Graphics.
IFIP Congress (1) 1971: 752-758 |