Howard R. Huff

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2001

1 Gennadi Bersuker, Yongjoo Jeon, Howard R. Huff: Degradation of thin oxides during electrical stress. Microelectronics Reliability 41(12): 1923-1931 (2001)

	2001
1		Gennadi Bersuker, Yongjoo Jeon, Howard R. Huff: Degradation of thin oxides during electrical stress. Microelectronics Reliability 41(12): 1923-1931 (2001)

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