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| 2012 | ||
|---|---|---|
| 17 | Xin Huang, Tianwei Zhang, Runsheng Wang, Changze Liu, Yuchao Liu, Ru Huang: Self-heating effects in gate-all-around silicon nanowire MOSFETs: Modeling and analysis. ISQED 2012: 727-731 | |
| 16 | Ziyi Hu, Yong Zhao, Xin'an Wang, Ru Huang, Teng Wang, Xing Zhang: Theory and verification of operator design methodology. SCIENCE CHINA Information Sciences 55(2): 480-490 (2012) | |
| 2011 | ||
| 15 | Ru Huang, Runsheng Wang, Jing Zhuge, Changze Liu, Tao Yu, Liangliang Zhang, Xin Huang, Yujie Ai, Jinbin Zou, Yuchao Liu, Jiewen Fan, Huailin Liao, Yangyuan Wang: Characterization and analysis of gate-all-around Si nanowire transistors for extreme scaling. CICC 2011: 1-8 | |
| 14 | Junhua Liu, Chen Li, Long Chen, Yehui Xiao, Jiayi Wang, Huailin Liao, Ru Huang: An ultra-low power 400MHz OOK transceiver for medical implanted applications. ESSCIRC 2011: 175-178 | |
| 13 | Le Ye, Congyin Shi, Huailin Liao, Ru Huang: A 0.47mW 6th-order 20MHz active filter using highly power-efficient Opamp. ISCAS 2011: 1640-1643 | |
| 12 | Ru Huang, Runsheng Wang, Changze Liu, Liangliang Zhang, Jing Zhuge, Yu Tao, Jinbin Zou, Yuchao Liu, Yangyuan Wang: HCI and NBTI induced degradation in gate-all-around silicon nanowire transistors. Microelectronics Reliability 51(9-11): 1515-1520 (2011) | |
| 11 | Frederick T. Chen, Heng-Yuan Lee, Yu-Sheng Chen, Yenya Hsu, Lijie Zhang, Pang-Shiu Chen, Weisu Chen, Peiyi Gu, Wenhsing Liu, Sumin Wang, Chen-Han Tsai, Shyh-Shyuan Sheu, Ming-Jinn Tsai, Ru Huang: Resistance switching for RRAM applications. SCIENCE CHINA Information Sciences 54(5): 1073-1086 (2011) | |
| 10 | Ru Huang, Bin Zhao, Runsheng Wang, Yimao Cai: Editor's note. SCIENCE CHINA Information Sciences 54(5): 913-914 (2011) | |
| 2010 | ||
| 9 | Ru Huang, Guang-Hui Xu: The design of energy-saving filtering mechanism for sensor networks. ICMLC 2010: 79-85 | |
| 8 | Le Ye, Huailin Liao, Fei Song, Jiang Chen, Chen Li, Jinshu Zhao, Ruiqiang Liu, Chuan Wang, Congyin Shi, Junhua Liu, Ru Huang, Yangyuan Wang: A Single-Chip CMOS UHF RFID Reader Transceiver for Chinese Mobile Applications. J. Solid-State Circuits 45(7): 1316-1329 (2010) | |
| 7 | Jian Wang, Wenhua Wang, Ru Huang, Yunpeng Pei, Shoubin Xue, Xin'an Wang, Chunhui Fan, Yangyuan Wang: Deteriorated radiation effects impact on the characteristics of MOS transistors with multi-finger configuration. Microelectronics Reliability 50(8): 1094-1097 (2010) | |
| 2009 | ||
| 6 | Ru Huang, HanMing Wu, Jinfeng Kang, DeYuan Xiao, XueLong Shi, Xia An, Yu Tian, Runsheng Wang, Liangliang Zhang, Xing Zhang, Yangyuan Wang: Challenges of 22 nm and beyond CMOS technology. Science in China Series F: Information Sciences 52(9): 1491-1533 (2009) | |
| 2008 | ||
| 5 | Yangyuan Wang, Xing Zhang, Xiaoyan Liu, Ru Huang: Novel devices and process for 32 nm CMOS technology and beyond. Science in China Series F: Information Sciences 51(6): 743-755 (2008) | |
| 4 | Ru Huang, FaLong Zhou, Yimao Cai, DaKe Wu, Xing Zhang: Novel vertical channel double gate structures for high density and low power flash memory applications. Science in China Series F: Information Sciences 51(6): 799-806 (2008) | |
| 2003 | ||
| 3 | Ru Huang, Jinyan Wang, Jin He, Min Yu, Xing Zhang, Yangyuan Wang: Hot carrier degradation behavior in SOI dynamic-threshold-voltage nMOSFET's (n-DTMOSFET) measured by gated-diode configuration. Microelectronics Reliability 43(5): 707-711 (2003) | |
| 2002 | ||
| 2 | Jin He, Xing Zhang, Ru Huang, Yangyuan Wang: Application of forward gated-diode R-G current method in extracting F-N stress-induced interface traps in SOI NMOSFETs. Microelectronics Reliability 42(1): 145-148 (2002) | |
| 2001 | ||
| 1 | Jin He, Xing Zhang, Ru Huang, Yangyuan Wang: Extraction of the lateral distribution of interface traps in MOSFETs by a novel combined gated-diode technique. Microelectronics Reliability 41(12): 1953-1957 (2001) | |
Colors in the list of coauthors
Last update Thu May 31 18:55:10 2012 CET by the DBLP Team —
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