Rei-Fu Huang

	2011
18		Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Kun-Lun Luo, Wen Ching Wu: A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories. IEEE Trans. VLSI Syst. 19(12): 2184-2194 (2011)
	2010
17		Chen-Wei Lin, Hung-Hsin Chen, Hao-Yu Yang, Mango Chia-Tso Chao, Rei-Fu Huang: Fault models and test methods for subthreshold SRAMs. ITC 2010: 427-436
	2009
16		Mango Chia-Tso Chao, Hao-Yu Yang, Rei-Fu Huang, Shih-Chin Lin, Ching-Yu Chin: Fault models for embedded-DRAM macros. DAC 2009: 714-719
	2008
15		Chi-Min Chang, Mango Chia-Tso Chao, Rei-Fu Huang, Ding-Yuan Chen: Testing Methodology of Embedded DRAMs. ITC 2008: 1-9
	2007
14		Rei-Fu Huang, Chao-Hsun Chen, Cheng-Wen Wu: Economic Aspects of Memory Built-in Self-Repair. IEEE Design & Test of Computers 24(2): 164-172 (2007)
13		Rei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu: Raisin: Redundancy Analysis Algorithm Simulation. IEEE Design & Test of Computers 24(4): 386-396 (2007)
	2005
12		Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu: A built-in self-repair design for RAMs with 2-D redundancy. IEEE Trans. VLSI Syst. 13(6): 742-745 (2005)
	2004
11		Rei-Fu Huang, Yan-Ting Lai, Yung-Fa Chou, Cheng-Wen Wu: SRAM delay fault modeling and test algorithm development. ASP-DAC 2004: 104-109
10		Chih-Tsun Huang, Jen-Chieh Yeh, Yuan-Yuan Shih, Rei-Fu Huang, Cheng-Wen Wu: On Test and Diagnostics of Flash Memories. Asian Test Symposium 2004: 260-265
9		Rei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang: Fail Pattern Identification for Memory Built-In Self-Repair. Asian Test Symposium 2004: 366-371
8		Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu: MRAM Defect Analysis and Fault Modeli. ITC 2004: 124-133
7		Li-Ming Denq, Rei-Fu Huang, Cheng-Wen Wu, Yeong-Jar Chang, Wen Ching Wu: A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories. MTDT 2004: 65-69
	2003
6		Rei-Fu Huang, Yung-Fa Chou, Cheng-Wen Wu: Defect Oriented Fault Analysis for SRAM. Asian Test Symposium 2003: 256-261
5		Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu: A Processor-Based Built-In Self-Repair Design for Embedded Memories. Asian Test Symposium 2003: 366-371
4		Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu, Peir-Yuan Tsai, Archer Hsu, Eugene Chow: A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy. ITC 2003: 393-402
3		Rei-Fu Huang, Li-Ming Denq, Cheng-Wen Wu, Jin-Fu Li: A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories. MTDT 2003: 53-
	2002
2		Rei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu: A Simulator for E aluating Redundancy Analysis Algorithms of Repairable Embedded Memories. IOLTW 2002: 262-
1		Rei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu: A Simulator for Evaluating Redundancy Analysis Algorithms of Repairable Embedded Memories. MTDT 2002: 68-

Coauthor Index

1	Chi-Min Chang	[15]
2	Yeong-Jar Chang	[7] [8] [9]
3	Mango Chia-Tso Chao	[15] [16] [17]
4	Chao-Hsun Chen	[14]
5	Ding-Yuan Chen	[15]
6	Hung-Hsin Chen	[17]
7	Ching-Yu Chin	[16]
8	Yung-Fa Chou	[6] [11]
9	Eugene Chow	[4]
10	Li-Ming Denq	[3] [7]
11	Archer Hsu	[4]
12	Chih-Tsun Huang	[10]
13	Chien-Chung Hung	[8]
14	Ming-Jer Kao	[8]
15	Yan-Ting Lai	[11]
16	Jin-Fu Li	[1] [2] [3] [4] [12] [13]
17	Chen-Wei Lin	[17]
18	Shen-Tien Lin	[9]
19	Shih-Chin Lin	[16]
20	Kun-Lun Luo	[9] [18]
21	Yuan-Yuan Shih	[10]
22	Chin-Lung Su	[5] [8] [9] [18]
23	Peir-Yuan Tsai	[4]
24	Cheng-Wen Wu	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [18]
25	Wen Ching Wu	[7] [8] [18]
26	Hao-Yu Yang	[16] [17]
27	Jen-Chieh Yeh	[1] [2] [4] [10] [12] [13]

Colors in the list of coauthors

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