Kuo-Yin Huang

	2005
1		Ching-Sung Ho, Kuo-Yin Huang, Ming Tang, Juin J. Liou: An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect. Microelectronics Reliability 45(7-8): 1144-1149 (2005)

Coauthor Index

1	Ching-Sung Ho	[1]
2	Juin J. Liou	[1]
3	Ming Tang	[1]

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