Kuo-Hon Huang

	2009
1		Chern-Sheng Lin, Kuo-Hon Huang, Yun-Long Lay, Kuo-Chun Wu, Yieng-Chiang Wu, Jim-Min Lin: An improved pattern match method with flexible mask for automatic inspection in the LCD manufacturing process. Expert Syst. Appl. 36(2): 3234-3239 (2009)

Coauthor Index

1	Yun-Long Lay	[1]
2	Chern-Sheng Lin	[1]
3	Jim-Min Lin	[1]
4	Kuo-Chun Wu	[1]
5	Yieng-Chiang Wu	[1]

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