Chifeng Huang

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2004

1 Leeing Tong, Hsingyin Lee, Chifeng Huang, Changke Lin, Chienhui Yang: Constructing Control Process for Wafer Defects Using Data Mining Technique. ICEB 2004: 1125-1129

	2004
1		Leeing Tong, Hsingyin Lee, Chifeng Huang, Changke Lin, Chienhui Yang: Constructing Control Process for Wafer Defects Using Data Mining Technique. ICEB 2004: 1125-1129

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