 | 2011 |
| 6 |  | M. Y. Tsai,
C. W. Ting,
C. Y. Huang,
Yi-Shao Lai:
Determination of residual strains of the EMC in PBGA during manufacturing and IR solder reflow processes.
Microelectronics Reliability 51(3): 642-648 (2011) |
| 2007 |
| 5 |  | A. H. I. Lee,
S. H. Chung,
C. Y. Huang:
Minimizing the Total Completion Time for the TFT-Array Factory Scheduling Problem (TAFSP).
ICCSA (1) 2007: 767-778 |
| 4 |  | W. L. Pearn,
H. N. Hung,
N. F. Peng,
C. Y. Huang:
Testing process precision for truncated normal distributions.
Microelectronics Reliability 47(12): 2275-2281 (2007) |
| 2005 |
| 3 |  | C. Sumodhee,
J. L. Hsieh,
C. T. Sun,
C. Y. Huang,
Arthur Y. M. Chen:
Impact of Social Behaviors on HIV Epidemic: A Computer Simulation View.
CIMCA/IAWTIC 2005: 550-556 |
| 2003 |
| 2 |  | J. D. Wu,
C. Y. Huang,
C. C. Liao:
Fracture strength characterization and failure analysis of silicon dies.
Microelectronics Reliability 43(2): 269-277 (2003) |
| 2002 |
| 1 |  | J. D. Wu,
S. H. Ho,
C. Y. Huang,
C. C. Liao,
P. J. Zheng,
S. C. Hung:
Board level reliability of a stacked CSP subjected to cyclic bending.
Microelectronics Reliability 42(3): 407-416 (2002) |