Zhiyuan Hu

	2012
6		Bingxu Ning, Zhengxuan Zhang, Zhangli Liu, Zhiyuan Hu, Ming Chen, Dawei Bi, Shichang Zou: Radiation-induced shallow trench isolation leakage in 180-nm flash memory technology. Microelectronics Reliability 52(1): 130-136 (2012)
	2011
5		Bingxu Ning, Zhiyuan Hu, Zhengxuan Zhang, Zhangli Liu, Ming Chen, Dawei Bi, Shichang Zou: The impact of total ionizing radiation on body effect. Microelectronics Journal 42(12): 1396-1399 (2011)
4		Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou: Impact of within-wafer process variability on radiation response. Microelectronics Journal 42(6): 883-888 (2011)
3		Zhangli Liu, Zhiyuan Hu, Zhengxuan Zhang, Hua Shao, Ming Chen, Dawei Bi, Bingxu Ning, Shichang Zou: Comparison of TID response in core, input/output and high voltage transistors for flash memory. Microelectronics Reliability 51(6): 1148-1151 (2011)
2		Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou: Total ionizing dose effects in elementary devices for 180-nm flash technologies. Microelectronics Reliability 51(8): 1295-1301 (2011)
	2004
1		Zhiyuan Hu, Yaowei Liu, Xiao Hu, Jianhua Li: Anonymous Micropayments Authentication(AMA) in Mobile Data Network. INFOCOM 2004

Coauthor Index

1	Dawei Bi	[2] [3] [4] [5] [6]
2	Ming Chen	[2] [3] [4] [5] [6]
3	Xiao Hu	[1]
4	Jianhua Li	[1]
5	Yaowei Liu	[1]
6	Zhangli Liu	[2] [3] [4] [5] [6]
7	Bingxu Ning	[2] [3] [4] [5] [6]
8	Hua Shao	[2] [3] [4]
9	Zhengxuan Zhang	[2] [3] [4] [5] [6]
10	Shichang Zou	[2] [3] [4] [5] [6]

Colors in the list of coauthors

Last update Thu May 31 18:55:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page