Weida Hu

	2006
1		Weida Hu, Xiaoshuang Chen, Xuchang Zhou, Zhijue Quan, Wei Lu: Quantum-mechanical effects and gate leakage current of nanoscale n-type FinFETs: A 2d simulation study. Microelectronics Journal 37(7): 613-619 (2006)

Coauthor Index

1	Xiaoshuang Chen	[1]
2	Wei Lu	[1]
3	Zhijue Quan	[1]
4	Xuchang Zhou	[1]

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