Hsin-Chyh Hsu

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2006

2 Hsin-Chyh Hsu, Ming-Dou Ker: Dummy-Gate Structure to Improve ESD Robustness in a Fully-Salicided 130-nm CMOS Technology without Using Extra Salicide-Blocking Mask. ISQED 2006: 503-506

2003

1 Ming-Dou Ker, Hsin-Chyh Hsu, Jeng-Jie Peng: Electrostatic Discharge Implantation to Improve Machine-Model ESD Robustness of Stacked NMOS in Mixed-Voltage I/O Interface Circuits. ISQED 2003: 363-368

	2006
2		Hsin-Chyh Hsu, Ming-Dou Ker: Dummy-Gate Structure to Improve ESD Robustness in a Fully-Salicided 130-nm CMOS Technology without Using Extra Salicide-Blocking Mask. ISQED 2006: 503-506
	2003
1		Ming-Dou Ker, Hsin-Chyh Hsu, Jeng-Jie Peng: Electrostatic Discharge Implantation to Improve Machine-Model ESD Robustness of Stacked NMOS in Mixed-Voltage I/O Interface Circuits. ISQED 2003: 363-368

Coauthor Index

1 Ming-Dou Ker [1] [2]

2 Jeng-Jie Peng [1]

Last update Thu May 31 18:55:10 2012 CET by the DBLP Team —

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