De D. Hsu

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1985

1 Earl E. Swartzlander Jr., John A. Eldon, De D. Hsu: VLSI Testing: A Decade of Experience. COMPCON 1985: 392-396

	1985
1		Earl E. Swartzlander Jr., John A. Eldon, De D. Hsu: VLSI Testing: A Decade of Experience. COMPCON 1985: 392-396

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