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| 2006 | ||
|---|---|---|
| 1 | Shun-Yen Lu, Pei-Ying Hsieh, Jing-Jia Liou: Exploring linear structures of critical path delay faults to reduce test efforts. ICCAD 2006: 100-106 | |
| 1 | Jing-Jia Liou | [1] |
| 2 | Shun-Yen Lu | [1] |
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