Min-Hsiung Hsieh

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2007

1 Min-Hsiung Hsieh, Shuen-Lin Jeng: Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin Gate Oxides. IEEE Transactions on Reliability 56(3): 369-380 (2007)

	2007
1		Min-Hsiung Hsieh, Shuen-Lin Jeng: Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin Gate Oxides. IEEE Transactions on Reliability 56(3): 369-380 (2007)

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