Michael S. Hsiao

	2012
159		Min Li, Michael S. Hsiao: RAG: An efficient reliability analysis of logic circuits on graphics processing units. DATE 2012: 316-319
158		Kameshwar Chandrasekar, Supratik K. Misra, Sanjay Sengupta, Michael S. Hsiao: A scan pattern debugger for partial scan industrial designs. DATE 2012: 558-561
157		Sarvesh Prabhu, Michael S. Hsiao, Loganathan Lingappan, Vijay Gangaram: A Novel SMT-Based Technique for LFSR Reseeding. VLSI Design 2012: 394-399
	2011
156		Sarvesh Prabhu, Michael S. Hsiao, Saparya Krishnamoorthy, Loganathan Lingappan, Vijay Gangaram, Jim Grundy: An Efficient 2-Phase Strategy to Achieve High Branch Coverage. Asian Test Symposium 2011: 167-174
155		Mainak Banga, Nikhil P. Rahagude, Michael S. Hsiao: Design-for-test methodology for non-scan at-speed testing. DATE 2011: 191-196
154		Min Li, Michael S. Hsiao: High-Performance Diagnostic Fault Simulation on GPUs. European Test Symposium 2011: 210
153		Wei Hu, Huy Nguyen, Michael S. Hsiao: Sufficiency-based filtering of invariants for Sequential Equivalence Checking. HLDVT 2011: 1-8
152		Min Li, Kelson Gent, Michael S. Hsiao: Utilizing GPGPUs for design validation with a modified Ant Colony Optimization. HLDVT 2011: 128-135
151		Mainak Banga, Michael S. Hsiao: ODETTE: A non-scan design-for-test methodology for Trojan detection in ICs. HOST 2011: 18-23
150		Sung Hee Park, Jonathan Leidig, Lin Tzy Li, Edward A. Fox, Nathan J. Short, Kevin E. Hoyle, A. Lynn Abbott, Michael S. Hsiao: Experiment and Analysis Services in a Fingerprint Digital Library for Collaborative Research. TPDL 2011: 179-191
149		Maheshwar Chandrasekar, Michael S. Hsiao: Fault Collapsing Using a Novel Extensibility Relation. VLSI Design 2011: 268-273
148		Sandesh Prabhakar, Rajamani Sethuram, Michael S. Hsiao: Trace Buffer-Based Silicon Debug with Lossless Compression. VLSI Design 2011: 358-363
147		Maheshwar Chandrasekar, Michael S. Hsiao: A Novel Learning Framework for State Space Exploration Based on Search State Extensibility Relation. VLSI Design 2011: 64-69
146		Min Li, Michael S. Hsiao: 3-D Parallel Fault Simulation With GPGPU. IEEE Trans. on CAD of Integrated Circuits and Systems 30(10): 1545-1555 (2011)
145		Shianling Wu, Laung-Terng Wang, Xiaoqing Wen, Zhigang Jiang, Lang Tan, Yu Zhang, Yu Hu, Wen-Ben Jone, Michael S. Hsiao, James Chien-Mo Li, Jiun-Lang Huang, Lizhen Yu: Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains. IEEE Trans. on CAD of Integrated Circuits and Systems 30(3): 455-463 (2011)
144		Saparya Krishnamoorthy, Michael S. Hsiao, Loganathan Lingappan: Strategies for scalable symbolic execution-driven test generation for programs. SCIENCE CHINA Information Sciences 54(9): 1797-1812 (2011)
	2010
143		Min Li, Michael S. Hsiao: FSimGP^2: An Efficient Fault Simulator with GPGPU. Asian Test Symposium 2010: 15-20
142		Nikhil P. Rahagude, Maheshwar Chandrasekar, Michael S. Hsiao: DFT + DFD: An Integrated Method for Design for Testability and Diagnosability. Asian Test Symposium 2010: 218-223
141		Neha Goel, Michael S. Hsiao, Naren Ramakrishnan, Mohammed J. Zaki: Mining Complex Boolean Expressions for Sequential Equivalence Checking. Asian Test Symposium 2010: 442-447
140		Saparya Krishnamoorthy, Michael S. Hsiao, Loganathan Lingappan: Tackling the Path Explosion Problem in Symbolic Execution-Driven Test Generation for Programs. Asian Test Symposium 2010: 59-64
139		Min Li, Yexin Zheng, Michael S. Hsiao, Chao Huang: Reversible logic synthesis through ant colony optimization. DATE 2010: 307-310
138		Mainak Banga, Michael S. Hsiao: Trusted RTL: Trojan Detection Methodology in Pre-silicon Designs. HOST 2010: 56-59
137		Sandesh Prabhakar, Michael S. Hsiao: Multiplexed trace signal selection using non-trivial implication-based correlation. ISQED 2010: 697-704
136		Maheshwar Chandrasekar, Nikhil P. Rahagude, Michael S. Hsiao: Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test Generation. J. Electronic Testing 26(2): 165-176 (2010)
	2009
135		Sandesh Prabhakar, Michael S. Hsiao: Using Non-trivial Logic Implications for Trace Buffer-Based Silicon Debug. Asian Test Symposium 2009: 131-136
134		Michael S. Hsiao, Mainak Banga: Kiss the Scan Goodbye: A Non-scan Architecture for High Coverage, Low Test Data Volume and Low Test Application Time. Asian Test Symposium 2009: 225-230
133		Nannan He, Michael S. Hsiao: An efficient path-oriented bitvector encoding width computation algorithm for bit-precise verification. DATE 2009: 1602-1607
132		Maheshwar Chandrasekar, Michael S. Hsiao: Diagnostic Test Generation for silicon diagnosis with an incremental learning framework based on search state compatibility. HLDVT 2009: 68-75
131		Mainak Banga, Michael S. Hsiao: VITAMIN: Voltage Inversion Technique to Ascertain Malicious Insertions in ICs. HOST 2009: 104-107
130		Min Li, Michael S. Hsiao: An ant colony optimization technique for abstraction-guided state justification. ITC 2009: 1-10
129		Swapneel Donglikar, Mainak Banga, Maheshwar Chandrasekar, Michael S. Hsiao: Fast circuit topology based method to configure the scan chains in Illinois Scan architecture. ITC 2009: 1-10
128		Kaigui Bian, Jung-Min Park, Michael S. Hsiao, France Belanger, Janine Hiller: Evaluation of Online Resources in Assisting Phishing Detection. SAINT 2009: 30-36
127		Mainak Banga, Michael S. Hsiao: A Novel Sustained Vector Technique for the Detection of Hardware Trojans. VLSI Design 2009: 327-332
	2008
126		Yexin Zheng, Michael S. Hsiao, Chao Huang: SAT-based equivalence checking of threshold logic designs for nanotechnologies. ACM Great Lakes Symposium on VLSI 2008: 225-230
125		Mainak Banga, Maheshwar Chandrasekar, Lei Fang, Michael S. Hsiao: Guided test generation for isolation and detection of embedded trojans in ics. ACM Great Lakes Symposium on VLSI 2008: 363-366
124		Lei Fang, Michael S. Hsiao: A Fast Approximation Algorithm for MIN-ONE SAT. DATE 2008: 1087-1090
123		Weixin Wu, Michael S. Hsiao: Efficient Design Validation Based on Cultural Algorithms. DATE 2008: 402-407
122		Xueqi Cheng, Michael S. Hsiao: Simulation-Directed Invariant Mining for Software Verification. DATE 2008: 682-687
121		Shianling Wu, Laung-Terng Wang, Zhigang Jiang, Jiayong Song, Boryau Sheu, Xiaoqing Wen, Michael S. Hsiao, James Chien-Mo Li, Jiun-Lang Huang, Ravi Apte: On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs. DFT 2008: 143-151
120		Mainak Banga, Michael S. Hsiao: A Region Based Approach for the Identification of Hardware Trojans. HOST 2008: 40-47
119		Xueqi Cheng, Michael S. Hsiao: Ant Colony Optimization directed program abstraction for software bounded model checking. ICCD 2008: 46-51
118		Shrirang M. Yardi, Michael S. Hsiao: Quantifying the energy efficiency of coordinated micro-architectural adaptation for multimedia workloads. ICCD 2008: 583-590
117		Weixin Wu, Michael S. Hsiao: SAT-based State Justification with Adaptive Mining of Invariants. ITC 2008: 1-10
116		Karthik Channakeshava, Kaigui Bian, Michael S. Hsiao, Jung-Min Park, Robert E. Crossler, France Belanger, Payal Aggarwal, Janine Hiller: On Providing Automatic Parental Consent over Information Collection from Children. Security and Management 2008: 196-202
115		Michael S. Hsiao, Robert B. Jones: Introduction to special section on high-level design, validation, and test. ACM Trans. Design Autom. Electr. Syst. 13(1): (2008)
114		Weixin Wu, Michael S. Hsiao: Mining Global Constraints With Domain Knowledge for Improving Bounded Sequential Equivalence Checking. IEEE Trans. on CAD of Integrated Circuits and Systems 27(1): 197-201 (2008)
113		Lei Fang, Michael S. Hsiao: Bilateral Testing of Nano-scale Fault-Tolerant Circuits. J. Electronic Testing 24(1-3): 285-296 (2008)
112		Hong-Sik Kim, Sungho Kang, Michael S. Hsiao: A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment. J. Electronic Testing 24(4): 365-378 (2008)
111		Lei Fang, Michael S. Hsiao: Boosting SAT Solver Performance via a New Hybrid Approach. JSAT 5(1-4): 243-261 (2008)
	2007
110		Michael S. Hsiao, France Belanger, Janine Hiller, Payal Aggarwal, Karthik Channakeshava, Kaigui Bian, Jung-Min Park: Parents and the Internet: Privacy Awareness, Practices and Control. AMCIS 2007: 460
109		Lei Fang, Michael S. Hsiao: A new hybrid solution to boost SAT solver performance. DATE 2007: 1307-1313
108		Nannan He, Michael S. Hsiao: Bounded model checking of embedded software in wireless cognitive radio systems. ICCD 2007: 19-24
107		Bin Li, Lei Fang, Michael S. Hsiao: Efficient power droop aware delay fault testing. ITC 2007: 1-10
106		Ankur Parikh, Weixin Wu, Michael S. Hsiao: Mining-guided state justification with partitioned navigation tracks. ITC 2007: 1-10
105		Vishnu C. Vimjam, Michael S. Hsiao: Explicit Safety Property Strengthening in SAT-based Induction. VLSI Design 2007: 63-68
104		Vishnu C. Vimjam, Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang: Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. VTS 2007: 231-238
103		Xiaoding Chen, Michael S. Hsiao: An Overlapping Scan Architecture for Reducing Both Test Time and Test Power by Pipelining Fault Detection. IEEE Trans. VLSI Syst. 15(4): 404-412 (2007)
	2006
102		Vishnu C. Vimjam, Michael S. Hsiao: Fast illegal state identification for improving SAT-based induction. DAC 2006: 241-246
101		Weixin Wu, Michael S. Hsiao: Mining global constraints for improving bounded sequential equivalence checking. DAC 2006: 743-748
100		Lei Fang, Michael S. Hsiao: Bilateral Testing of Nano-scale Fault-tolerant Circuits. DFT 2006: 309-317
99		Kameshwar Chandrasekar, Michael S. Hsiao: Implicit Search-Space Aware Cofactor Expansion: A Novel Preimage Computation Technique. ICCD 2006
98		Manan Syal, Kameshwar Chandrasekar, Vishnu C. Vimjam, Michael S. Hsiao, Yi-Shing Chang, Sreejit Chakravarty: A Study of Implication Based Pseudo Functional Testing. ITC 2006: 1-10
97		Xiaoding Chen, Michael S. Hsiao: Characteristic States and Cooperative Game Based Search for Efficient Sequential ATPG and Design Validation. ITC 2006: 1-10
96		Vishnu C. Vimjam, Michael S. Hsiao: Efficient Fault Collapsing via Generalized Dominance Relations. VTS 2006: 258-265
95		Qingwei Wu, Michael S. Hsiao: A New Simulation-Based Property Checking Algorithm Based on Partitioned Alternative Search Space Traversal. IEEE Trans. Computers 55(11): 1325-1334 (2006)
94		Xiaoding Chen, Michael S. Hsiao: Testing Embedded Sequential Cores in Parallel Using Spectrum-Based BIST. IEEE Trans. Computers 55(2): 150-162 (2006)
93		Qingwei Wu, Michael S. Hsiao: State Variable Extraction and Partitioning to Reduce Problem Complexity for ATPG and Design Validation. IEEE Trans. on CAD of Integrated Circuits and Systems 25(10): 2275-2282 (2006)
92		Liang Zhang, Indradeep Ghosh, Michael S. Hsiao: A Framework for Automatic Design Validation of RTL Circuits Using ATPG and Observability-Enhanced Tag Coverage. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2526-2538 (2006)
91		Manan Syal, Michael S. Hsiao: New techniques for untestable fault identification in sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 25(6): 1117-1131 (2006)
	2005
90		Vishnu C. Vimjam, Manan Syal, Michael S. Hsiao: Untestable fault identification through enhanced necessary value assignments. ACM Great Lakes Symposium on VLSI 2005: 176-181
89		Ronald P. Lajaunie, Michael S. Hsiao: An effective and efficient ATPG-based combinational equivalence checker. ACM Great Lakes Symposium on VLSI 2005: 248-253
88		Kameshwar Chandrasekar, Michael S. Hsiao: Forward image computation with backtracing ATPG and incremental state-set construction. ACM Great Lakes Symposium on VLSI 2005: 254-259
87		Manan Syal, Michael S. Hsiao, Suriyaprakash Natarajan, Sreejit Chakravarty: Untestable Multi-Cycle Path Delay Faults in Industrial Designs. Asian Test Symposium 2005: 194-201
86		Liang Zhang, Mukul R. Prasad, Michael S. Hsiao: Interleaved Invariant Checking with Dynamic Abstraction. CHARME 2005: 81-96
85		Liang Zhang, Mukul R. Prasad, Michael S. Hsiao, Thomas Sidle: Dynamic abstraction using SAT-based BMC. DAC 2005: 754-757
84		Kameshwar Chandrasekar, Michael S. Hsiao: Integration of Learning Techniques into Incremental Satisfiability for Efficient Path-Delay Fault Test Generation. DATE 2005: 1002-1007
83		Shrirang M. Yardi, Michael S. Hsiao, Thomas L. Martin, Dong S. Ha: Quality-Driven Proactive Computation Elimination for Power-Aware Multimedia Processing. DATE 2005: 340-345
82		Shrirang M. Yardi, Karthik Channakeshava, Michael S. Hsiao, Thomas L. Martin, Dong S. Ha: A Formal Framework for Modeling and Analysis of System-Level Dynamic Power Management. ICCD 2005: 119-126
81		Manan Syal, Rajat Arora, Michael S. Hsiao: Extended Forward Implications and Dual Recurrence Relations to Identify Sequentially Untestable Faults. ICCD 2005: 453-460
80		Kameshwar Chandrasekar, Michael S. Hsiao: State Set Management for SAT-based Unbounded Model Checking. ICCD 2005: 585-590
79		Xueqi Cheng, Michael S. Hsiao: Region-level approximate computation reuse for power reduction in multimedia applications. ISLPED 2005: 119-122
78		Daniel C. Nash, Thomas L. Martin, Dong S. Ha, Michael S. Hsiao: Towards an Intrusion Detection System for Battery Exhaustion Attacks on Mobile Computing Devices. PerCom Workshops 2005: 141-145
77		Kameshwar Chandrasekar, Michael S. Hsiao: Q-PREZ: QBF Evaluation Using Partition, Resolution and Elimination with ZBDDs. VLSI Design 2005: 189-194
76		Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran: Efficient techniques for transition testing. ACM Trans. Design Autom. Electr. Syst. 10(2): 258-278 (2005)
75		Xiao Liu, Michael S. Hsiao: A Novel Transition Fault ATPG That Reduces Yield Loss. IEEE Design & Test of Computers 22(6): 576-584 (2005)
74		Anand L. D'Souza, Michael S. Hsiao: Error Diagnosis of Sequential Circuits Using Region-Based Model. J. Electronic Testing 21(2): 115-126 (2005)
	2004
73		Bin Li, Michael S. Hsiao, Shuo Sheng: A Novel SAT All-Solutions Solver for Efficient Preimage Computation. DATE 2004: 272-279
72		Liang Zhang, Mukul R. Prasad, Michael S. Hsiao: Incremental deductive & inductive reasoning for SAT-based bounded model checking. ICCAD 2004: 502-509
71		Manan Syal, Michael S. Hsiao, Sreejit Chakravarty: Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks. ITC 2004: 1034-1043
70		Puneet Gupta, Michael S. Hsiao: ALAPTF: A new Transition Faultmodel and the ATPG Algorithm. ITC 2004: 1053-1060
69		Kameshwar Chandrasekar, Michael S. Hsiao: Decision Selection and Learning for an All-Solutions ATPG Engine. ITC 2004: 607-616
68		Qingwei Wu, Michael S. Hsiao: State Variable Extraction to Reduce Problem Complexity for ATPG and Design Validation. ITC 2004: 820-829
67		Thomas L. Martin, Michael S. Hsiao, Dong S. Ha, Jayan Krishnaswami: Denial-of-Service Attacks on Battery-powered Mobile Computers. PerCom 2004: 309-318
66		Manan Syal, Michael S. Hsiao: Untestable Fault Identification using Recurrence Relations and Impossible Value Assignments. VLSI Design 2004: 481-486
65		Mukul R. Prasad, Michael S. Hsiao, Jawahar Jain: Can SAT be used to Improve Sequential ATPG Methods? VLSI Design 2004: 585-
64		Rajat Arora, Michael S. Hsiao: Enhancing SAT-based Bounded Model Checking using Sequential Logic Implications. VLSI Design 2004: 784-787
63		Qingwei Wu, Michael S. Hsiao: Efficient ATPG for Design Validation Based On Partitioned State Exploration Histories. VTS 2004: 389-405
62		Shuo Sheng, Michael S. Hsiao: Success-Driven Learning in ATPG for Preimage Computation. IEEE Design & Test of Computers 21(6): 504-512 (2004)
61		Rajat Arora, Michael S. Hsiao: Using Global Structural Relationships of Signals to Accelerate SAT-based Combinational Equivalence Checking. J. UCS 10(12): 1597-1628 (2004)
	2003
60		Liang Zhang, Michael S. Hsiao, Indradeep Ghosh: Automatic Design Validation Framework for HDL Descriptions via RTL ATPG. Asian Test Symposium 2003: 148-153
59		Manan Syal, Michael S. Hsiao: A Novel, Low-Cost Algorithm for Sequentially Untestable Fault Identification. DATE 2003: 10316-10321
58		Shuo Sheng, Michael S. Hsiao: Efficient Preimage Computation Using A Novel Success-Driven ATPG. DATE 2003: 10822-10827
57		Xiao Liu, Michael S. Hsiao: Constrained ATPG for Broadside Transition Testing. DFT 2003: 175-
56		Qingwei Wu, Michael S. Hsiao: Efficient Sequential ATPG Based on Partitioned Finite-State-Machine Traversal. ITC 2003: 281-289
55		Liang Zhang, Indradeep Ghosh, Michael S. Hsiao: Efficient Sequential ATPG for Functional RTL Circuits. ITC 2003: 290-298
54		Puneet Gupta, Michael S. Hsiao: High Quality ATPG for Delay Defects. ITC 2003: 584-591
53		Xiaoding Chen, Michael S. Hsiao: Energy-Efficient Logic BIST Based on State Correlation Analysis. VTS 2003: 267-272
52		Manan Syal, Michael S. Hsiao, Kiran B. Doreswamy, Sreejit Chakravarty: Efficient Implication - Based Untestable Bridge Fault Identifier. VTS 2003: 393-402
51		Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran: Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors. J. Electronic Testing 19(4): 437-445 (2003)
	2002
50		Shuo Sheng, Koichiro Takayama, Michael S. Hsiao: Effective safety property checking using simulation-based sequential ATPG. DAC 2002: 813-818
49		Michael S. Hsiao: Maximizing Impossibilities for Untestable Fault Identification. DATE 2002: 949-953
48		Xiaoding Chen, Michael S. Hsiao: Characteristic faults and spectral information for logic BIST. ICCAD 2002: 294-298
47		Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran: Techniques to Reduce Data Volume and Application Time for Transition Test. ITC 2002: 983-992
46		Mukul R. Prasad, Michael S. Hsiao, Jawahar Jain: Improving Sequential ATPG Using SAT Methods. IWLS 2002: 79-84
45		Yufeng Zhao, Michael S. Hsiao: Reducing Power Consumption by Utilizing Retransmission in Short Range Wireless Network. LCN 2002: 527-533
44		Phillip Stanley-Marbell, Michael S. Hsiao, Ulrich Kremer: A Hardware Architecture for Dynamic Performance and Energy Adaptation. PACS 2002: 33-52
43		Ganapathy Kasturirangan, Michael S. Hsiao: Spectrum-Based BIST in Complex SOCs. VTS 2002: 111-116
42		Shuo Sheng, Michael S. Hsiao: Efficient Sequential Test Generation Based on Logic Simulation. IEEE Design & Test of Computers 19(5): 56-64 (2002)
41		Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal: State and Fault Information for Compaction-Based Test Generation. J. Electronic Testing 18(1): 63-72 (2002)
40		Sandhya Seshadri, Michael S. Hsiao: Behavioral-Level DFT via Formal Operator Testability Measures. J. Electronic Testing 18(6): 595-611 (2002)
	2001
39		Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal: Efficient spectral techniques for sequential ATPG. DATE 2001: 204-208
38		Phillip Stanley-Marbell, Michael S. Hsiao: Fast, flexible, cycle-accurate energy estimation. ISLPED 2001: 141-146
37		Chung-Hsing Hsu, Ulrich Kremer, Michael S. Hsiao: Compiler-directed dynamic voltage/frequency scheduling for energy reduction in mircoprocessors. ISLPED 2001: 275-278
36		Nandini Sridhar, Michael S. Hsiao: On efficient error diagnosis of digital circuits. ITC 2001: 678-687
35		Anand L. D'Souza, Michael S. Hsiao: Error Diagnosis of Sequential Circuits Using Region-Based Mode. VLSI Design 2001: 103-
34		Sameer Sharma, Michael S. Hsiao: Combination of Structural and State Analysis for Partial Scan. VLSI Design 2001: 134-
33		Nachiketh R. Potlapally, Michael S. Hsiao, Anand Raghunathan, Ganesh Lakshminarayana, Srimat T. Chakradhar: Accurate Power Macro-modeling Techniques for Complex RTL Circuits. VLSI Design 2001: 235-241
32		Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal: Novel Spectral Methods for Built-In Self-Test in a System-on-a-Chip Environment. VTS 2001: 163-168
31		Matthew Arnold, Michael S. Hsiao, Ulrich Kremer, Barbara G. Ryder: Exploring the Interaction between Java?s Implicitly Thrown Exceptions and Instruction Scheduling. International Journal of Parallel Programming 29(2): 111-137 (2001)
	2000
30		Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal: Compaction-based test generation using state and fault information. Asian Test Symposium 2000: 159-164
29		Ruofan Xu, Michael S. Hsiao: Embedded core testing using genetic algorithms. Asian Test Symposium 2000: 254-259
28		Kabir Gulrajani, Michael S. Hsiao: Multi-Node Static Logic Implications for Redundancy Identification. DATE 2000: 729-733
27		Chung-Hsing Hsu, Ulrich Kremer, Michael S. Hsiao: Compiler-Directed Dynamic Frequency and Voltage Scheduling. PACS 2000: 65-81
26		Ankur Jain, Vamsi Boppana, Rajarshi Mukherjee, Jawahar Jain, Masahiro Fujita, Michael S. Hsiao: Testing, Verification, and Diagnosis in the Presence of Unknowns. VTS 2000: 263-270
25		Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Dynamic state traversal for sequential circuit test generation. ACM Trans. Design Autom. Electr. Syst. 5(3): 548-565 (2000)
24		Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Peak power estimation of VLSI circuits: new peak power measures. IEEE Trans. VLSI Syst. 8(4): 435-439 (2000)
23		Sandhya Seshadri, Michael S. Hsiao: Formal Value-Range and Variable Testability Techniques for High-Level Design-For-Testability. J. Electronic Testing 16(1-2): 131-145 (2000)
22		Michael S. Hsiao, Srimat T. Chakradhar: Test Set Compaction Using Relaxed Subsequence Removal. J. Electronic Testing 16(4): 319-327 (2000)
21		Michael S. Hsiao, Srimat T. Chakradhar: Test Set and Fault Partitioning Techniques for Static Test Sequence Compaction for Sequential Circuits. J. Electronic Testing 16(4): 329-338 (2000)
	1999
20		Michael S. Hsiao: Peak Power Estimation Using Genetic Spot Optimization for Large VLSI Circuits. DATE 1999: 175-
19		Sandhya Seshadri, Michael S. Hsiao: An integrated approach to behavioral-level design-for-testability using value-range and variable testability techniques. ITC 1999: 858-867
18		Matthew Arnold, Michael S. Hsiao, Ulrich Kremer, Barbara G. Ryder: Instruction Scheduling in the Presence of Java's Runtime Exceptions. LCPC 1999: 18-34
17		Sameer Sharma, Michael S. Hsiao: Partial Scan Using Multi-Hop State Reachability Analysis. VTS 1999: 121-127
16		Ankur Jain, Michael S. Hsiao, Vamsi Boppana, Masahiro Fujita: On the Evaluation of Arbitrary Defect Coverage of Test Sets. VTS 1999: 426-432
15		Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Fast Static Compaction Algorithms for Sequential Circuit Test Vectors. IEEE Trans. Computers 48(3): 311-322 (1999)
14		Michael S. Hsiao: On Non-Statistical Techniques for Fast Fault Coverage Estimation. J. Electronic Testing 15(3): 239-254 (1999)
	1998
13		Michael S. Hsiao, Srimat T. Chakradhar: Partitioning and Reordering Techniques for Static Test Sequence Compaction of Sequential Circuits. Asian Test Symposium 1998: 452-457
12		Michael S. Hsiao, Srimat T. Chakradhar: State Relaxation Based Subsequence Removal for Fast Static Compaction in Sequential Circuits. DATE 1998: 577-582
11		Michael S. Hsiao: A fast, accurate, and non-statistical method for fault coverage estimation. ICCAD 1998: 155-161
10		Michael S. Hsiao, Gurjeet S. Saund, Elizabeth M. Rudnick, Janak H. Patel: Partial Scan Selection Based on Dynamic Reachability and Observability Information. VLSI Design 1998: 174-180
9		Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Application of genetically engineered finite-state-machine sequences to sequential circuit ATPG. IEEE Trans. on CAD of Integrated Circuits and Systems 17(3): 239-254 (1998)
	1997
8		Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Sequential circuit test generation using dynamic state traversal. ED&TC 1997: 22-28
7		Gurjeet S. Saund, Michael S. Hsiao, Janak H. Patel: Partial Scan beyond Cycle Cutting. FTCS 1997: 320-328
6		Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Effects of delay models on peak power estimation of VLSI sequential circuits. ICCAD 1997: 45-51
5		Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: K2: an estimator for peak sustainable power of VLSI circuits. ISLPED 1997: 178-183
4		Dilip Krishnaswamy, Michael S. Hsiao, Vikram Saxena, Elizabeth M. Rudnick, Janak H. Patel, Prithviraj Banerjee: Parallel Genetic Algorithms for Simulation-Based Sequential Circuit Test Generation. VLSI Design 1997: 475-481
3		Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors. VTS 1997: 188-195
	1996
2		Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Automatic test generation using genetically-engineered distinguishing sequences. VTS 1996: 216-223
	1995
1		Michael S. Hsiao, Janak H. Patel: A new architectural-level fault simulation using propagation prediction of grouped fault-effects. ICCD 1995: 628-

Coauthor Index

1	A. Lynn Abbott	[150]
2	Payal Aggarwal	[110] [116]
3	Vishwani D. Agrawal	[30] [32] [39] [41]
4	Enamul Amyeen	[104]
5	Ravi Apte	[121]
6	Matthew Arnold	[18] [31]
7	Rajat Arora	[61] [64] [81]
8	Prithviraj Banerjee (Prith Banerjee)	[4]
9	Mainak Banga	[120] [125] [127] [129] [131] [134] [138] [151] [155]
10	France Belanger	[110] [116] [128]
11	Kaigui Bian	[110] [116] [128]
12	Vamsi Boppana	[16] [26]
13	Srimat T. Chakradhar	[12] [13] [21] [22] [33]
14	Sreejit Chakravarty	[47] [51] [52] [71] [76] [87] [98]
15	Kameshwar Chandrasekar	[69] [77] [80] [84] [88] [98] [99] [158]
16	Maheshwar Chandrasekar	[125] [129] [132] [136] [142] [147] [149]
17	Yi-Shing Chang	[98]
18	Karthik Channakeshava	[82] [110] [116]
19	Xiaoding Chen	[48] [53] [94] [97] [103]
20	Xueqi Cheng	[79] [119] [122]
21	Robert E. Crossler	[116]
22	Anand L. D'Souza	[35] [74]
23	Swapneel Donglikar	[129]
24	Kiran B. Doreswamy	[52]
25	Lei Fang	[100] [107] [109] [111] [113] [124] [125]
26	Edward A. Fox	[150]
27	Masahiro Fujita	[16] [26]
28	Vijay Gangaram	[156] [157]
29	Kelson Gent	[152]
30	Indradeep Ghosh	[55] [60] [92]
31	Ashish Giani	[30] [32] [39] [41]
32	Neha Goel	[141]
33	Jim Grundy	[156]
34	Kabir Gulrajani	[28]
35	Ruifeng Guo	[104]
36	Puneet Gupta	[54] [70]
37	Dong S. Ha	[67] [78] [82] [83]
38	Nannan He	[108] [133]
39	Janine Hiller	[110] [116] [128]
40	Kevin E. Hoyle	[150]
41	Chung-Hsing Hsu	[27] [37]
42	Wei Hu	[153]
43	Yu Hu	[145]
44	Chao Huang	[126] [139]
45	Jiun-Lang Huang	[121] [145]
46	Ankur Jain	[16] [26]
47	Jawahar Jain	[26] [46] [65]
48	Zhigang Jiang	[121] [145]
49	Wen-Ben Jone	[145]
50	Robert B. Jones	[115]
51	Sungho Kang	[112]
52	Ganapathy Kasturirangan	[43]
53	Hong-Sik Kim	[112]
54	Ulrich Kremer	[18] [27] [31] [37] [44]
55	Saparya Krishnamoorthy	[140] [144] [156]
56	Jayan Krishnaswami	[67]
57	Dilip Krishnaswamy	[4]
58	Ronald P. Lajaunie	[89]
59	Ganesh Lakshminarayana	[33]
60	Jonathan Leidig	[150]
61	Bin Li	[73] [107]
62	Chien-Mo James Li (James Chien-Mo Li, J. C.-M. Li)	[121] [145]
63	Lin Tzy Li	[150]
64	Min Li	[130] [139] [143] [146] [152] [154] [159]
65	Loganathan Lingappan	[140] [144] [156] [157]
66	Xiao Liu	[47] [51] [57] [75] [76]
67	Thomas L. Martin	[67] [78] [82] [83]
68	Supratik K. Misra	[158]
69	Rajarshi Mukherjee	[26]
70	Daniel C. Nash	[78]
71	Suriyaprakash Natarajan	[87]
72	Huy Nguyen	[153]
73	Ankur Parikh	[106]
74	Sung Hee Park	[150]
75	Jung-Min Park (Jung-Min "Jerry" Park)	[110] [116] [128]
76	Janak H. Patel	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [15] [24] [25]
77	Nachiketh R. Potlapally	[33]
78	Sandesh Prabhakar	[135] [137] [148]
79	Sarvesh Prabhu	[156] [157]
80	Mukul R. Prasad	[46] [65] [72] [85] [86]
81	Anand Raghunathan	[33]
82	Nikhil P. Rahagude	[136] [142] [155]
83	Naren Ramakrishnan	[141]
84	Elizabeth M. Rudnick	[2] [3] [4] [5] [6] [8] [9] [10] [15] [24] [25]
85	Barbara G. Ryder	[18] [31]
86	Gurjeet S. Saund	[7] [10]
87	Vikram Saxena	[4]
88	Sanjay Sengupta	[158]
89	Sandhya Seshadri	[19] [23] [40]
90	Rajamani Sethuram	[148]
91	Sameer Sharma	[17] [34]
92	Shuo Sheng	[30] [32] [39] [41] [42] [50] [58] [62] [73]
93	Boryau Sheu	[121]
94	Nathan J. Short	[150]
95	Thomas Sidle	[85]
96	Jiayong Song	[121]
97	Nandini Sridhar	[36]
98	Phillip Stanley-Marbell	[38] [44]
99	Manan Syal	[52] [59] [66] [71] [81] [87] [90] [91] [98]
100	Koichiro Takayama	[50]
101	Lang Tan	[145]
102	Paul J. Thadikaran	[47] [51] [76]
103	Srikanth Venkataraman	[104]
104	Vishnu C. Vimjam	[90] [96] [98] [102] [104] [105]
105	Laung-Terng Wang	[121] [145]
106	Xiaoqing Wen	[121] [145]
107	Qingwei Wu	[56] [63] [68] [93] [95]
108	Shianling Wu	[121] [145]
109	Weixin Wu	[101] [106] [114] [117] [123]
110	Ruofan Xu	[29]
111	Kai Yang	[104]
112	Shrirang M. Yardi	[82] [83] [118]
113	Lizhen Yu	[145]
114	Mohammed Javeed Zaki (Mohammed J. Zaki)	[141]
115	Liang Zhang	[55] [60] [72] [85] [86] [92]
116	Yu Zhang	[145]
117	Yufeng Zhao	[45]
118	Yexin Zheng	[126] [139]

Colors in the list of coauthors

Last update Sat Jun 2 20:57:36 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page