M. Houssa

	2007
4		A. Shickova, Ben Kaczer, A. Veloso, M. Aoulaiche, M. Houssa, H. E. Maes, Guido Groeseneken, J. A. Kittl: NBTI reliability of Ni FUSI/HfSiON gates: Effect of silicide phase. Microelectronics Reliability 47(4-5): 505-507 (2007)
3		M. Houssa, M. Aoulaiche, Stefan De Gendt, Guido Groeseneken, Marc M. Heyns: Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling. Microelectronics Reliability 47(6): 880-889 (2007)
	2005
2		M. Houssa: Modelling negative bias temperature instabilities in advanced p-MOSFETs. Microelectronics Reliability 45(1): 3-12 (2005)
	2001
1		C. Zhao, G. Roebben, H. Bender, E. Young, S. Haukka, M. Houssa, M. Naili, Stefan De Gendt, Marc M. Heyns, Omer Van der Biest: In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction. Microelectronics Reliability 41(7): 995-998 (2001)

Coauthor Index

1	M. Aoulaiche	[3] [4]
2	H. Bender	[1]
3	Omer Van der Biest	[1]
4	Stefan De Gendt	[1] [3]
5	Guido Groeseneken	[3] [4]
6	S. Haukka	[1]
7	Marc M. Heyns	[1] [3]
8	Ben Kaczer	[4]
9	J. A. Kittl	[4]
10	H. E. Maes	[4]
11	M. Naili	[1]
12	G. Roebben	[1]
13	A. Shickova	[4]
14	A. Veloso	[4]
15	E. Young	[1]
16	C. Zhao	[1]

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