Toshinori Hosokawa

	2010
18		Masayoshi Yoshimura, Hiroshi Ogawa, Toshinori Hosokawa, Koji Yamazaki: Evaluation of transition untestable faults using a multi-cycle capture test generation method. DDECS 2010: 273-276
17		Ryoichi Inoue, Toshinori Hosokawa, Hideo Fujiwara: A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint. IEICE Transactions 93-D(1): 24-32 (2010)
	2005
16		Hideyuki Ichihara, Tomoo Inoue, Naoki Okamoto, Toshinori Hosokawa, Hideo Fujiwara: An Effective Design for Hierarchical Test Generation Based on Strong Testability. Asian Test Symposium 2005: 288-293
	2004
15		Masahide Miyazaki, Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka, Hideo Fujiwara: A DFT Selection Method for Reducing Test Application Time of System-on-Chips. IEICE Transactions 87-D(3): 609-619 (2004)
	2003
14		Toshinori Hosokawa, Hiroshi Date, Masahide Miyazaki, Michiaki Muraoka, Hideo Fujiwara: A Method of Test Plan Grouping to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint. Asian Test Symposium 2003: 130-135
13		Masahide Miyazaki, Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka, Hideo Fujiwara: A DFT Selection Method for Reducing Test Application Time of System-on-Chips. Asian Test Symposium 2003: 412-417
	2002
12		Masayoshi Yoshimura, Toshinori Hosokawa, Mitsuyasu Ohta: A Test Point Insertion Method to Reduce the Number of Test Patterns. Asian Test Symposium 2002: 298-304
11		Hiroshi Date, Toshinori Hosokawa, Michiaki Muraoka: A SoC Test Strategy Based on a Non-Scan DFT Method. Asian Test Symposium 2002: 305-310
10		Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka: A State Reduction Method for Non-Scan Based FSM Testing with Don't Care Inputs Identification Technique. Asian Test Symposium 2002: 55-60
9		Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka: A Test Generation Method Using a Compacted Test Table and a Test Generation Method Using a Compacted Test Plan Table for RTL Data Path Circuits. VTS 2002: 328-335
8		Toshinori Hosokawa, Tomoo Inoue, Toshihiro Hiraoka, Hideo Fujiwara: Test sequence compaction methods for acyclic sequential circuits using a time expansion model. Systems and Computers in Japan 33(10): 105-115 (2002)
	2001
7		Toshinori Hosokawa, Masayoshi Yoshimura, Mitsuyasu Ohta: Design for testability strategies using full/partial scan designs and test point insertions to reduce test application times. ASP-DAC 2001: 485-491
	1999
6		Toshinori Hosokawa, Toshihiro Hiraoka, Tomoo Inoue, Hideo Fujiwara: Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential Circuits Using a Time Expansion Model. Asian Test Symposium 1999: 192-
	1998
5		Tomoo Inoue, Toshinori Hosokawa, Takahiro Mihara, Hideo Fujiwara: An Optimal Time Expansion Model Based on Combinational ATPG for RT level Circuits. Asian Test Symposium 1998: 190-197
	1997
4		Toshinori Hosokawa, Toshihiro Hiraoka, Mitsuyasu Ohta, Michiaki Muraoka, Shigeo Kuninobu: A Partial Scan Design Method Based on n-Fold Line-up Structures. Asian Test Symposium 1997: 306-
	1996
3		Toshinori Hosokawa, Kenichi Kawaguchi, Mitsuyasu Ohta, Michiaki Muraoka: A Design for testability Method Using RTL Partitioning. Asian Test Symposium 1996: 88-93
	1995
2		Akira Motohara, Sadami Takeoka, Toshinori Hosokawa, Mitsuyasu Ohta, Yuji Takai, Michihiro Matsumoto, Michiaki Muraoka: Design for testability using register-transfer level partial scan selection. ASP-DAC 1995
	1993
1		Akira Motohara, Toshinori Hosokawa, Michiaki Muraoka, Hidetsugu Maekawa, Kazuhiro Kayashima, Yasuharu Shimeki, Seichi Shin: A State Traversal Algorithm Using a State Covariance Matrix. DAC 1993: 97-101

Coauthor Index

1	Hiroshi Date	[9] [10] [11] [13] [14] [15]
2	Hideo Fujiwara	[5] [6] [8] [13] [14] [15] [16] [17]
3	Toshihiro Hiraoka	[4] [6] [8]
4	Hideyuki Ichihara	[16]
5	Ryoichi Inoue	[17]
6	Tomoo Inoue	[5] [6] [8] [16]
7	Kenichi Kawaguchi	[3]
8	Kazuhiro Kayashima	[1]
9	Shigeo Kuninobu	[4]
10	Hidetsugu Maekawa	[1]
11	Michihiro Matsumoto	[2]
12	Takahiro Mihara	[5]
13	Masahide Miyazaki	[13] [14] [15]
14	Akira Motohara	[1] [2]
15	Michiaki Muraoka	[1] [2] [3] [4] [9] [10] [11] [13] [14] [15]
16	Hiroshi Ogawa	[18]
17	Mitsuyasu Ohta	[2] [3] [4] [7] [12]
18	Naoki Okamoto	[16]
19	Yasuharu Shimeki	[1]
20	Seichi Shin	[1]
21	Yuji Takai	[2]
22	Sadami Takeoka	[2]
23	Koji Yamazaki	[18]
24	Masayoshi Yoshimura	[7] [12] [18]

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