 | 2011 |
| 20 |  | Hamidreza Hashempour,
Jos Dohmen,
Bratislav Tasic,
Bram Kruseman,
Camelia Hora,
Maikel van Beurden,
Yizi Xing:
Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example.
DATE 2011: 371-376 |
| 19 |  | Bram Kruseman,
Bratislav Tasic,
Camelia Hora,
Jos Dohmen,
Hamidreza Hashempour,
Maikel van Beurden,
Yizi Xing:
Defect Oriented Testing for analog/mixed-signal devices.
ITC 2011: 1-10 |
| 18 |  | Daniel Arumí,
Rosa Rodríguez Montanes,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman:
Gate Leakage Impact on Full Open Defects in Interconnect Lines.
IEEE Trans. VLSI Syst. 19(12): 2209-2220 (2011) |
| 17 |  | Daniel Arumí,
Rosa Rodríguez Montanes,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman:
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out.
IEEE Trans. on CAD of Integrated Circuits and Systems 30(12): 1911-1922 (2011) |
| 2010 |
| 16 |  | Rosa Rodríguez-Montañés,
Daniel Arumí,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman:
Diagnosis of full open defects in interconnect lines with fan-out.
European Test Symposium 2010: 233-238 |
| 15 |  | Lavanya Jagan,
Camelia Hora,
Bram Kruseman,
Stefan Eichenberger,
Ananta K. Majhi,
V. Kamakoti:
Impact of Temperature on Test Quality.
VLSI Design 2010: 276-281 |
| 2009 |
| 14 |  | Friedrich Hapke,
Rene Krenz-Baath,
Andreas Glowatz,
Jürgen Schlöffel,
Hamidreza Hashempour,
Stefan Eichenberger,
Camelia Hora,
Dan Adolfsson:
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs.
ITC 2009: 1-10 |
| 2008 |
| 13 |  | Rosa Rodríguez-Montañés,
Daniel Arumí,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman:
Time-dependent Behaviour of Full Open Defects in Interconnect Lines.
ITC 2008: 1-10 |
| 12 |  | Stefan Eichenberger,
Jeroen Geuzebroek,
Camelia Hora,
Bram Kruseman,
Ananta K. Majhi:
Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality.
ITC 2008: 1-10 |
| 11 |  | Daniel Arumí,
Rosa Rodríguez-Montañés,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman:
Full Open Defects in Nanometric CMOS.
VTS 2008: 119-124 |
| 2007 |
| 10 |  | Daniel Arumí,
Rosa Rodríguez-Montañés,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman,
Maurice Lousberg,
Ananta K. Majhi:
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
VTS 2007: 145-150 |
| 9 |  | Rosa Rodríguez-Montañés,
Daniel Arumí,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman,
Maurice Lousberg,
Ananta K. Majhi:
Diagnosis of Full Open Defects in Interconnecting Lines.
VTS 2007: 158-166 |
| 8 |  | Xinyue Fan,
Will R. Moore,
Camelia Hora,
Guido Gronthoud:
Extending gate-level diagnosis tools to CMOS intra-gate faults.
IET Computers & Digital Techniques 1(6): 685-693 (2007) |
| 2006 |
| 7 |  | Xinyue Fan,
Will R. Moore,
Camelia Hora,
Mario H. Konijnenburg,
Guido Gronthoud:
A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis.
VTS 2006: 266-271 |
| 2005 |
| 6 |  | Xinyue Fan,
Will R. Moore,
Camelia Hora,
Guido Gronthoud:
A novel stuck-at based method for transistor stuck-open fault diagnosis.
ITC 2005: 9 |
| 2004 |
| 5 |  | Bram Kruseman,
Ananta K. Majhi,
Camelia Hora,
Stefan Eichenberger,
Johan Meirlevede:
Systematic Defects in Deep Sub-Micron Technologies.
ITC 2004: 290-299 |
| 4 |  | Bart Vermeulen,
Camelia Hora,
Bram Kruseman,
Erik Jan Marinissen,
Robert Van Rijsinge:
Trends in Testing Integrated Circuits.
ITC 2004: 688-697 |
| 2003 |
| 3 |  | Ananta K. Majhi,
Guido Gronthoud,
Camelia Hora,
Maurice Lousberg,
Pop Valer,
Stefan Eichenberger:
Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model.
VTS 2003: 345-350 |
| 2 |  | Camelia Hora,
Rene Segers,
Stefan Eichenberger,
Maurice Lousberg:
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up.
J. Electronic Testing 19(4): 369-376 (2003) |
| 2002 |
| 1 |  | Camelia Hora,
Rene Segers,
Stefan Eichenberger,
Maurice Lousberg:
An Effective Diagnosis Method to Support Yield Improvement.
ITC 2002: 260-269 |