Yeoh Eng Hong

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1998

2 Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong: High volume microprocessor test escapes, an analysis of defects our tests are missing. ITC 1998: 25-34

1997

1 Yeoh Eng Hong, Martin Tay Tiong We: The Application of Novel Failure Analysis Techniques for Advanced Multi-Layered CMOS Devices. ITC 1997: 304-309

	1998
2		Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong: High volume microprocessor test escapes, an analysis of defects our tests are missing. ITC 1998: 25-34
	1997
1		Yeoh Eng Hong, Martin Tay Tiong We: The Application of Novel Failure Analysis Techniques for Advanced Multi-Layered CMOS Devices. ITC 1997: 304-309

Coauthor Index

1 Wayne M. Needham [2]

2 Cheryl Prunty [2]

3 Martin Tay Tiong We [1]

Colors in the list of coauthors

Last update Thu May 31 18:55:10 2012 CET by the DBLP Team —

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1	Wayne M. Needham	[2]
2	Cheryl Prunty	[2]
3	Martin Tay Tiong We	[1]