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| 2010 | ||
|---|---|---|
| 2 | Ted Hong, Yanjing Li, Sung-Boem Park, Diana Mui, David Lin, Ziyad Abdel Kaleq, Nagib Hakim, Helia Naeimi, Donald S. Gardner, Subhasish Mitra: QED: Quick Error Detection tests for effective post-silicon validation. ITC 2010: 154-163 | |
| 2009 | ||
| 1 | Sung-Boem Park, Ted Hong, Subhasish Mitra: Post-Silicon Bug Localization in Processors Using Instruction Footprint Recording and Analysis (IFRA). IEEE Trans. on CAD of Integrated Circuits and Systems 28(10): 1545-1558 (2009) | |
| 1 | Donald S. Gardner | [2] |
| 2 | Nagib Hakim | [2] |
| 3 | Ziyad Abdel Kaleq | [2] |
| 4 | Yanjing Li | [2] |
| 5 | David Lin | [2] |
| 6 | Subhasish Mitra | [1] [2] |
| 7 | Diana Mui | [2] |
| 8 | Helia Naeimi | [2] |
| 9 | Sung-Boem Park | [1] [2] |
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