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 | 2007 | |
|---|---|---|
| 3 |      | Linda Milor, Changsoo Hong: Backend dielectric breakdown dependence on linewidth and pattern density. Microelectronics Reliability 47(9-11): 1473-1477 (2007) |
| 2 | | Changsoo Hong, Linda Milor: Modeling of the breakdown mechanisms for porous copper/low-k process flows. Microelectronics Reliability 47(9-11): 1478-1482 (2007) |
| 2005 | ||
| 1 | | Changsoo Hong, Linda S. Milor, Munkang Choi, Tom Lin: Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models. Microelectronics Reliability 45(9-11): 1305-1310 (2005) |
| 1 | Munkang Choi | [1] |
| 2 | Tom Lin | [1] |
| 3 | Linda S. Milor (Linda Milor) | [1] [2] [3] |
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