Tsutomu Hondo

	2007
4		Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: Detection of CMOS Open Node Defects by Frequency Analysis. IEICE Transactions 90-D(3): 685-687 (2007)
	2004
3		Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. IEICE Transactions 87-D(3): 551-556 (2004)
	2003
2		Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. Asian Test Symposium 2003: 406-411
	2002
1		Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. Asian Test Symposium 2002: 417-422

Coauthor Index

1	Toshifumi Kobayashi	[1] [2] [3] [4]
2	Hiroyuki Michinishi	[1] [2] [3] [4]
3	Takuji Okamoto	[1] [2] [3] [4]
4	Tokumi Yokohira	[1] [2] [3] [4]

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