W. Y. Ho

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2006

2 T. H. Lin, W. P. Shih, W. C. Chen, W. Y. Ho: 3D face authentication by mutual coupled 3D and 2D feature extraction. ACM Southeast Regional Conference 2006: 423-427

2001

1 W. Y. Ho, C. Surya: Study of light-induced annealing effects in a-Si: H thin films. Microelectronics Reliability 41(6): 913-917 (2001)

	2006
2		T. H. Lin, W. P. Shih, W. C. Chen, W. Y. Ho: 3D face authentication by mutual coupled 3D and 2D feature extraction. ACM Southeast Regional Conference 2006: 423-427
	2001
1		W. Y. Ho, C. Surya: Study of light-induced annealing effects in a-Si: H thin films. Microelectronics Reliability 41(6): 913-917 (2001)

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