Takayuki Hisaka

	2009
2		Takayuki Hisaka, Hajime Sasaki, Yoichi Nogami, Kenji Hosogi, Naohito Yoshida, A. A. Villanueva, Jesús A. del Alamo, Shigehiko Hasegawa, Hajime Asahi: Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions. Microelectronics Reliability 49(12): 1515-1519 (2009)
	2005
1		Takayuki Hisaka, Yasuki Aihara, Yoichi Nogami, Hajime Sasaki, Yasushi Uehara, Naohito Yoshida, Kazuo Hayashi: Degradation mechanisms of GaAs PHEMTs in high humidity conditions. Microelectronics Reliability 45(12): 1894-1900 (2005)

Coauthor Index

1	Yasuki Aihara	[1]
2	Jesús A. del Alamo	[2]
3	Hajime Asahi	[2]
4	Shigehiko Hasegawa	[2]
5	Kazuo Hayashi	[1]
6	Kenji Hosogi	[2]
7	Yoichi Nogami	[1] [2]
8	Hajime Sasaki	[1] [2]
9	Yasushi Uehara	[1]
10	A. A. Villanueva	[2]
11	Naohito Yoshida	[1] [2]

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