Takahisa Hiraide

	2008
5		Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo: Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate. IEICE Transactions 91-D(3): 726-735 (2008)
	2006
4		Noriyuki Ito, Akira Kanuma, Daisuke Maruyama, Hitoshi Yamanaka, Tsuyoshi Mochizuki, Osamu Sugawara, Chihiro Endoh, Masahiro Yanagida, Takeshi Kono, Yutaka Isoda, Kazunobu Adachi, Takahisa Hiraide, Shigeru Nagasawa, Yaroku Sugiyama, Eizo Ninoi: Delay defect screening for a 2.16GHz SPARC64 microprocessor. ASP-DAC 2006: 342-347
3		Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo: Test Data Compression of 100x for Scan-Based BIST. ITC 2006: 1-10
	2003
2		Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama: BIST-Aided Scan Test - A New Method for Test Cost Reduction. VTS 2003: 359-364
	1987
1		Gotaro Odawara, Takahisa Hiraide, Osamu Nishina: Partitioning and Placement Technique for CMOS Gate Arrays. IEEE Trans. on CAD of Integrated Circuits and Systems 6(3): 355-363 (1987)

Coauthor Index

1	Kazunobu Adachi	[4]
2	Takashi Aikyo	[3] [5]
3	Masayuki Arai	[3] [5]
4	Kwame Osei Boateng	[2]
5	Michiaki Emori	[2] [3] [5]
6	Chihiro Endoh	[4]
7	Satoshi Fukumoto	[3] [5]
8	Yutaka Isoda	[4]
9	Koichi Itaya	[2]
10	Noriyuki Ito	[4]
11	Kazuhiko Iwasaki	[3] [5]
12	Akira Kanuma	[4]
13	Hideaki Konishi	[2] [3] [5]
14	Takeshi Kono	[4]
15	Daisuke Maruyama	[4]
16	Tatsuru Matsuo	[3] [5]
17	Takashi Mochiyama	[2]
18	Tsuyoshi Mochizuki	[4]
19	Shigeru Nagasawa	[4]
20	Eizo Ninoi	[4]
21	Osamu Nishina	[1]
22	Gotaro Odawara	[1]
23	Osamu Sugawara	[4]
24	Yaroku Sugiyama	[4]
25	Hitoshi Yamanaka	[2] [4]
26	Masahiro Yanagida	[4]

Colors in the list of coauthors

Last update Thu May 31 18:55:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page