Kensuke Hino

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1997

2 Kazuo Iwama, Kensuke Hino, Hiroyuki Kurokawa, Sunao Sawada: Random benchmark circuits with controlled attributes. ED&TC 1997: 90-97

1994

1 Kazuo Iwama, Kensuke Hino: Random Generation of Test Instances for Logic Optimizers. DAC 1994: 430-434

	1997
2		Kazuo Iwama, Kensuke Hino, Hiroyuki Kurokawa, Sunao Sawada: Random benchmark circuits with controlled attributes. ED&TC 1997: 90-97
	1994
1		Kazuo Iwama, Kensuke Hino: Random Generation of Test Instances for Logic Optimizers. DAC 1994: 430-434

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