Hitoshi Hikima

	1997
1		Toshinobu Ono, Kazuo Wakui, Hitoshi Hikima, Yoshiyuki Nakamura, Masaaki Yoshida: Integrated and Automated Design-for-Testability Implementation for Cell-Based ICs. Asian Test Symposium 1997: 122-125

Coauthor Index

1	Yoshiyuki Nakamura	[1]
2	Toshinobu Ono	[1]
3	Kazuo Wakui	[1]
4	Masaaki Yoshida	[1]

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