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| 2005 | ||
|---|---|---|
| 2 | Kaname Yamasaki, Iwao Suzuki, Azumi Kobayashi, Keiichi Horie, Yasuharu Kobayashi, Hideyuki Aoki, Hideki Hayashi, Kenichi Tada, Koki Tsutsumida, Keiichi Higeta: External memory BIST for system-in-package. ITC 2005: 10 | |
| 1999 | ||
| 1 | Shigeru Nakahara, Keiichi Higeta, Masaki Kohno, Toshiaki Kawamura, Keizo Kakitani: Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm. ITC 1999: 301-310 | |
Colors in the list of coauthors
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