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| 1997 | ||
|---|---|---|
| 1 | Michinobu Nakao, Kazumi Hatayama, Isao Higashi: Accelerated Test Points Selection Method for Scan-Based BIST. Asian Test Symposium 1997: 359- | |
| 1 | Kazumi Hatayama | [1] |
| 2 | Michinobu Nakao | [1] |
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