Marc M. Heyns

	2007
4		M. Houssa, M. Aoulaiche, Stefan De Gendt, Guido Groeseneken, Marc M. Heyns: Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling. Microelectronics Reliability 47(6): 880-889 (2007)
	2005
3		G. S. Lujan, W. Magnus, L.-Å. Ragnarsson, S. Kubicek, Stefan De Gendt, Marc M. Heyns, K. De Meyer: Modelling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance. Microelectronics Reliability 45(5-6): 794-797 (2005)
	2001
2		C. Zhao, G. Roebben, H. Bender, E. Young, S. Haukka, M. Houssa, M. Naili, Stefan De Gendt, Marc M. Heyns, Omer Van der Biest: In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction. Microelectronics Reliability 41(7): 995-998 (2001)
	1999
1		Marc M. Heyns, Twan Bearda, Ingrid Cornelissen, Stefan De Gendt, Robin Degraeve, Guido Groeseneken, Conny Kenens, D. Martin Knotter, Lee M. Loewenstein, Paul W. Mertens, Sofie Mertens, Marc Meuris, Tanya Nigam, Marc Schaekers, Ivo Teerlinck, Wilfried Vandervorst, Rita Vos, Klaus Wolke: Cost-effective cleaning and high-quality thin gate oxides. IBM Journal of Research and Development 43(3): 339-350 (1999)

Coauthor Index

1	M. Aoulaiche	[4]
2	Twan Bearda	[1]
3	H. Bender	[2]
4	Omer Van der Biest	[2]
5	Ingrid Cornelissen	[1]
6	Robin Degraeve	[1]
7	Stefan De Gendt	[1] [2] [3] [4]
8	Guido Groeseneken	[1] [4]
9	S. Haukka	[2]
10	M. Houssa	[2] [4]
11	Conny Kenens	[1]
12	D. Martin Knotter	[1]
13	S. Kubicek	[3]
14	Lee M. Loewenstein	[1]
15	G. S. Lujan	[3]
16	W. Magnus	[3]
17	Paul W. Mertens	[1]
18	Sofie Mertens	[1]
19	Marc Meuris	[1]
20	K. De Meyer	[3]
21	M. Naili	[2]
22	Tanya Nigam	[1]
23	L.-Å. Ragnarsson	[3]
24	G. Roebben	[2]
25	Marc Schaekers	[1]
26	Ivo Teerlinck	[1]
27	Wilfried Vandervorst	[1]
28	Rita Vos	[1]
29	Klaus Wolke	[1]
30	E. Young	[2]
31	C. Zhao	[2]

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