V. De Heyn

	2003
3		Vesselin K. Vassilev, S. Jenei, Guido Groeseneken, R. Venegas, Steven Thijs, V. De Heyn, M. Natarajan Iyer, Michiel Steyaert, H. E. Maes: High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices. Microelectronics Reliability 43(7): 1011-1020 (2003)
	2002
2		Bart Keppens, V. De Heyn, M. Natarajan Iyer, Vesselin K. Vassilev, Guido Groeseneken: Significance of the failure criterion on transmission line pulse testing. Microelectronics Reliability 42(6): 901-907 (2002)
	2001
1		Karlheinz Bock, Bart Keppens, V. De Heyn, Guido Groeseneken, L. Y. Ching, A. Naem: Influence of gate length on ESD-performance for deep submicron CMOS technology. Microelectronics Reliability 41(3): 375-383 (2001)

Coauthor Index

1	Karlheinz Bock	[1]
2	L. Y. Ching	[1]
3	Guido Groeseneken	[1] [2] [3]
4	M. Natarajan Iyer	[2] [3]
5	S. Jenei	[3]
6	Bart Keppens	[1] [2]
7	H. E. Maes	[3]
8	A. Naem	[1]
9	Michiel Steyaert	[3]
10	Steven Thijs	[3]
11	Vesselin K. Vassilev	[2] [3]
12	R. Venegas	[3]

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