 | 1997 |
|---|
| 8 |       | Edward I. Cole Jr.,
Jerry M. Soden,
Paiboon Tangyunyong,
Patrick L. Candelaria,
Richard W. Beegle,
Daniel L. Barton,
Christopher L. Henderson,
Charles F. Hawkins:
Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects.
ITC 1997: 23-31 |
| 7 | | Christopher L. Henderson,
Jerry M. Soden:
Signature Analysis for IC Diagnosis and Failure Analysis.
ITC 1997: 310-318 |
| 6 | | Jerry M. Soden,
Christopher L. Henderson:
IC Diagnosis: Industry Issues.
ITC 1997: 435 |
| 5 |  | Jerry M. Soden,
Christopher L. Henderson:
Still in the Stone Age?
IEEE Design & Test of Computers 14(3): 128- (1997) |
| 4 | | Jerry M. Soden,
Richard E. Anderson,
Christopher L. Henderson:
IC Failure Analysis: Magic, Mystery, and Science.
IEEE Design & Test of Computers 14(3): 59-69 (1997) |
| 1996 |
|---|
| 3 | | Jerry M. Soden,
Richard E. Anderson,
Christopher L. Henderson:
IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science.
ITC 1996: 935 |
| 1992 |
|---|
| 2 | | Christopher L. Henderson,
Richard H. Williams,
Charles F. Hawkins:
Economic Impact of Type I Test Errors at System and Board Levels.
ITC 1992: 444-452 |
| 1991 |
|---|
| 1 | | Christopher L. Henderson,
Jerry M. Soden,
Charles F. Hawkins:
The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits.
ITC 1991: 302-310 |
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