P. L. F. Hemment

	2001
1		A. C. Lamb, J. F. W. Schiz, J. M. Bonar, F. Cristiano, P. Ashburn, S. Hall, P. L. F. Hemment: Characterisation of emitter/base leakage currents in SiGe HBTs produced using selective epitaxy. Microelectronics Reliability 41(2): 273-279 (2001)

Coauthor Index

1	P. Ashburn	[1]
2	J. M. Bonar	[1]
3	F. Cristiano	[1]
4	S. Hall	[1]
5	A. C. Lamb	[1]
6	J. F. W. Schiz	[1]

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