 | 2012 |
| 10 |  | Khaled R. Heloue,
Sari Onaissi,
Farid N. Najm:
Efficient Block-Based Parameterized Timing Analysis Covering All Potentially Critical Paths.
IEEE Trans. on CAD of Integrated Circuits and Systems 31(4): 472-484 (2012) |
| 2009 |
| 9 |  | Sari Onaissi,
Khaled R. Heloue,
Farid N. Najm:
Clock skew optimization via wiresizing for timing sign-off covering all process corners.
DAC 2009: 196-201 |
| 8 |  | Khaled R. Heloue,
Chandramouli V. Kashyap,
Farid N. Najm:
Quantifying robustness metrics in parameterized static timing analysis.
ICCAD 2009: 209-216 |
| 7 |  | Sari Onaissi,
Khaled R. Heloue,
Farid N. Najm:
PSTA-based branch and bound approach to the silicon speedpath isolation problem.
ICCAD 2009: 217-224 |
| 6 |  | Khaled R. Heloue,
Navid Azizi,
Farid N. Najm:
Full-Chip Model for Leakage-Current Estimation Considering Within-Die Correlation.
IEEE Trans. on CAD of Integrated Circuits and Systems 28(6): 874-887 (2009) |
| 2008 |
| 5 |  | Khaled R. Heloue,
Farid N. Najm:
Parameterized timing analysis with general delay models and arbitrary variation sources.
DAC 2008: 403-408 |
| 4 |  | Khaled R. Heloue,
Sari Onaissi,
Farid N. Najm:
Efficient block-based parameterized timing analysis covering all potentially critical paths.
ICCAD 2008: 173-180 |
| 3 |  | Khaled R. Heloue,
Farid N. Najm:
Early Analysis and Budgeting of Margins and Corners Using Two-Sided Analytical Yield Models.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(10): 1826-1839 (2008) |
| 2007 |
| 2 |  | Khaled R. Heloue,
Navid Azizi,
Farid N. Najm:
Modeling and Estimation of Full-Chip Leakage Current Considering Within-Die Correlation.
DAC 2007: 93-98 |
| 2005 |
| 1 |  | Khaled R. Heloue,
Farid N. Najm:
Statistical timing analysis with two-sided constraints.
ICCAD 2005: 829-836 |