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Khaled R. Heloue Coauthor index pubzone.org

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DBLP keys2012
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKhaled R. Heloue, Sari Onaissi, Farid N. Najm: Efficient Block-Based Parameterized Timing Analysis Covering All Potentially Critical Paths. IEEE Trans. on CAD of Integrated Circuits and Systems 31(4): 472-484 (2012)
2009
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSari Onaissi, Khaled R. Heloue, Farid N. Najm: Clock skew optimization via wiresizing for timing sign-off covering all process corners. DAC 2009: 196-201
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKhaled R. Heloue, Chandramouli V. Kashyap, Farid N. Najm: Quantifying robustness metrics in parameterized static timing analysis. ICCAD 2009: 209-216
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSari Onaissi, Khaled R. Heloue, Farid N. Najm: PSTA-based branch and bound approach to the silicon speedpath isolation problem. ICCAD 2009: 217-224
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKhaled R. Heloue, Navid Azizi, Farid N. Najm: Full-Chip Model for Leakage-Current Estimation Considering Within-Die Correlation. IEEE Trans. on CAD of Integrated Circuits and Systems 28(6): 874-887 (2009)
2008
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKhaled R. Heloue, Farid N. Najm: Parameterized timing analysis with general delay models and arbitrary variation sources. DAC 2008: 403-408
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKhaled R. Heloue, Sari Onaissi, Farid N. Najm: Efficient block-based parameterized timing analysis covering all potentially critical paths. ICCAD 2008: 173-180
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKhaled R. Heloue, Farid N. Najm: Early Analysis and Budgeting of Margins and Corners Using Two-Sided Analytical Yield Models. IEEE Trans. on CAD of Integrated Circuits and Systems 27(10): 1826-1839 (2008)
2007
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKhaled R. Heloue, Navid Azizi, Farid N. Najm: Modeling and Estimation of Full-Chip Leakage Current Considering Within-Die Correlation. DAC 2007: 93-98
2005
1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKhaled R. Heloue, Farid N. Najm: Statistical timing analysis with two-sided constraints. ICCAD 2005: 829-836

Coauthor Index

1Navid Azizi [2] [6]
2Chandramouli V. Kashyap [8]
3Farid N. Najm [1] [2] [3] [4] [5] [6] [7] [8] [9] [10]
4Sari Onaissi [4] [7] [9] [10]

Last update Thu May 31 18:55:10 2012 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page