Sybille Hellebrand

	2011
45		Alejandro Cook, Sybille Hellebrand, Thomas Indlekofer, Hans-Joachim Wunderlich: Diagnostic Test of Robust Circuits. Asian Test Symposium 2011: 285-290
44		Ilia Polian, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, Peter C. Maxwell: Towards Variation-Aware Test Methods. European Test Symposium 2011: 219-225
43		Fabian Hopsch, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, Hans-Joachim Wunderlich: Variation-aware fault modeling. SCIENCE CHINA Information Sciences 54(9): 1813-1826 (2011)
	2010
42		Fabian Hopsch, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, Hans-Joachim Wunderlich: Variation-Aware Fault Modeling. Asian Test Symposium 2010: 87-93
41		Thomas Indlekofer, Michael Schnittger, Sybille Hellebrand: Efficient test response compaction for robust BIST using parity sequences. ICCD 2010: 480-485
40		Viktor Froese, Rüdiger Ibers, Sybille Hellebrand: Reusing NoC-infrastructure for test data compression. VTS 2010: 227-231
39		Sybille Hellebrand: Nano-electronic Systems (Nano-elektronische Systeme). it - Information Technology 52(4): 179-180 (2010)
	2009
38		Sybille Hellebrand, Marc Hunger: Are Robust Circuits Really Robust? DFT 2009: 77-77
37		Marc Hunger, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, Bernd Becker: ATPG-based grading of strong fault-secureness. IOLTS 2009: 269-274
	2008
36		Philipp Öhler, Alberto Bosio, Giorgio Di Natale, Sybille Hellebrand: A Modular Memory BIST for Optimized Memory Repair. IOLTS 2008: 171-172
35		Marc Hunger, Sybille Hellebrand: Verification and Analysis of Self-Checking Properties through ATPG. IOLTS 2008: 25-30
34		Uranmandakh Amgalan, Christian Hachmann, Sybille Hellebrand, Hans-Joachim Wunderlich: Signature Rollback - A Technique for Testing Robust Circuits. VTS 2008: 125-130
	2007
33		Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich: Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair. DDECS 2007: 185-190
32		Sybille Hellebrand, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, Bernd Straube: A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction. DFT 2007: 50-58
31		Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich: An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. European Test Symposium 2007: 91-96
30		Muhammad Ali, Michael Welzl, Sven Hessler, Sybille Hellebrand: An efficient fault tolerant mechanism to deal with permanent and transient failures in a network on chip. IJHPSA 1(2): 113-123 (2007)
	2006
29		Bernd Becker, Ilia Polian, Sybille Hellebrand, Bernd Straube, Hans-Joachim Wunderlich: DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems). it - Information Technology 48(5): 304- (2006)
	2004
28		Armin Würtenberger, Christofer S. Tautermann, Sybille Hellebrand: Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. ITC 2004: 926-935
	2003
27		Armin Würtenberger, Christofer S. Tautermann, Sybille Hellebrand: A Hybrid Coding Strategy For Optimized Test Data Compression. ITC 2003: 451-459
	2002
26		Sybille Hellebrand, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, Vyacheslav N. Yarmolik: Efficient Online and Offline Testing of Embedded DRAMs. IEEE Trans. Computers 51(7): 801-809 (2002)
25		Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich: A Mixed-Mode BIST Scheme Based on Folding Compression. J. Comput. Sci. Technol. 17(2): 203-212 (2002)
24		Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich: Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. J. Electronic Testing 18(2): 159-170 (2002)
	2001
23		Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich: Two-dimensional test data compression for scan-based deterministic BIST. ITC 2001: 894-902
22		Sybille Hellebrand, Huaguo Liang, Hans-Joachim Wunderlich: A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. J. Electronic Testing 17(3-4): 341-349 (2001)
	2000
21		Sybille Hellebrand, Hans-Joachim Wunderlich, Huaguo Liang: A mixed mode BIST scheme based on reseeding of folding counters. ITC 2000: 778-784
	1999
20		Sybille Hellebrand, Hans-Joachim Wunderlich, Vyacheslav N. Yarmolik: Symmetric Transparent BIST for RAMs. DATE 1999: 702-707
19		Vyacheslav N. Yarmolik, I. V. Bykov, Sybille Hellebrand, Hans-Joachim Wunderlich: Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms. EDCC 1999: 339-350
18		Sybille Hellebrand, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, Vyacheslav N. Yarmolik: Error Detecting Refreshment for Embedded DRAMs. VTS 1999: 384-390
	1998
17		Vyacheslav N. Yarmolik, Sybille Hellebrand, Hans-Joachim Wunderlich: Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs. DATE 1998: 173-179
16		Andre Hertwig, Sybille Hellebrand, Hans-Joachim Wunderlich: Fast Self-Recovering Controllers. VTS 1998: 296-302
15		Sybille Hellebrand, Hans-Joachim Wunderlich, Andre Hertwig: Synthesizing Fast, Online-Testable Control Units. IEEE Design & Test of Computers 15(4): 36-41 (1998)
14		Sybille Hellebrand, Hans-Joachim Wunderlich, Andre Hertwig: Mixed-Mode BIST Using Embedded Processors. J. Electronic Testing 12(1-2): 127-138 (1998)
	1997
13		Kun-Han Tsai, Sybille Hellebrand, Janusz Rajski, Malgorzata Marek-Sadowska: STARBIST: Scan Autocorrelated Random Pattern Generation. DAC 1997: 472-477
	1996
12		Sybille Hellebrand, Hans-Joachim Wunderlich, Andre Hertwig: Mixed-Mode BIST Using Embedded Processors. ITC 1996: 195-204
	1995
11		Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, Hans-Joachim Wunderlich: Pattern generation for a deterministic BIST scheme. ICCAD 1995: 88-94
10		Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois: Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Trans. Computers 44(2): 223-233 (1995)
	1994
9		Sybille Hellebrand, Hans-Joachim Wunderlich: Synthesis of Self-Testable Controllers. EDAC-ETC-EUROASIC 1994: 580-585
8		Sybille Hellebrand, Hans-Joachim Wunderlich: An efficient procedure for the synthesis of fast self-testable controller structures. ICCAD 1994: 110-116
	1992
7		Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski: Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. ITC 1992: 120-129
6		Hans-Joachim Wunderlich, Sybille Hellebrand: The pseudoexhaustive test of sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 26-33 (1992)
	1990
5		Sybille Hellebrand, Hans-Joachim Wunderlich: Tools and devices supporting the pseudo-exhaustive test. EURO-DAC 1990: 13-17
4		Sybille Hellebrand, Hans-Joachim Wunderlich, Oliver F. Haberl: Generating pseudo-exhaustive vectors for external testing. ITC 1990: 670-679
	1989
3		Sybille Hellebrand, Hans-Joachim Wunderlich: The Pseudo-Exhaustive Test of Sequential Circuits. ITC 1989: 19-27
	1988
2		Hans-Joachim Wunderlich, Sybille Hellebrand: Generating pattern sequences for the pseudo-exhaustive test of MOS-circuits. FTCS 1988: 36-41
1		Sybille Hellebrand, Hans-Joachim Wunderlich: Automatisierung des Entwurfs vollständig testbarer Schaltungen. GI Jahrestagung (2) 1988: 145-159

Coauthor Index

1	Muhammad Ali	[30]
2	Uranmandakh Amgalan	[34]
3	Bernd Becker	[29] [37] [42] [43] [44]
4	Alberto Bosio	[36]
5	I. V. Bykov	[19]
6	Alejandro Cook	[45]
7	Bernard Courtois	[7] [10]
8	Torsten Coym	[32]
9	Alejandro Czutro	[37]
10	Viktor Froese	[40]
11	Oliver F. Haberl	[4]
12	Christian Hachmann	[34]
13	Andre Hertwig	[12] [14] [15] [16]
14	Sven Hessler	[30]
15	Fabian Hopsch	[42] [43]
16	Marc Hunger	[35] [37] [38]
17	Rüdiger Ibers	[40]
18	Thomas Indlekofer	[41] [45]
19	Alexander A. Ivaniuk	[18] [26]
20	Yuri V. Klimets	[18] [26]
21	Huaguo Liang	[21] [22] [23] [24] [25]
22	Stefan Ludwig	[32]
23	Malgorzata Marek-Sadowska	[13]
24	Peter C. Maxwell	[44]
25	Giorgio Di Natale	[36]
26	Philipp Öhler	[31] [33] [36]
27	Ilia Polian	[29] [37] [42] [43] [44]
28	Janusz Rajski	[7] [10] [13]
29	Birgit Reeb	[11]
30	Michael Schnittger	[41]
31	Bernd Straube	[29] [32] [42] [43]
32	Steffen Tarnick	[7] [10] [11]
33	Christofer S. Tautermann	[27] [28]
34	Kun-Han Tsai	[13]
35	Srikanth Venkataraman	[10]
36	Wolfgang Vermeiren	[42] [43]
37	Michael Welzl	[30]
38	Hans-Joachim Wunderlich	[1] [2] [3] [4] [5] [6] [8] [9] [11] [12] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [29] [31] [32] [33] [34] [42] [43] [44] [45]
39	Armin Würtenberger	[27] [28]
40	Vyacheslav N. Yarmolik (V. N. Yarmolik, Vyacheslav Nikolaevich Yarmolik)	[17] [18] [19] [20] [26]
41	Christian G. Zoellin	[32]

Colors in the list of coauthors

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