 | 2010 |
|---|
| 7 |       | J. Virkki,
T. Seppälä,
L. Frisk,
P. Heino:
Accelerated testing for failures of tantalum capacitors.
Microelectronics Reliability 50(2): 217-219 (2010) |
| 2003 |
|---|
| 6 | | S. Myllymaki,
Eero Ristolainen,
P. Heino,
A. Lehto,
K. Varjonen:
Evaluation Of Resonating Channel Transistor In SOI Wafer.
International Journal of Computational Engineering Science 4(3): 711-714 (2003) |
| 5 | | P. Heino,
Eero Ristolainen:
Thermal conduction at the nanoscale in some metals by MD.
Microelectronics Journal 34(9): 773-777 (2003) |
| 4 | | P. Heino,
Eero Ristolainen:
Strength of Ta-Si interfaces by molecular dynamics.
Microelectronics Reliability 43(4): 645-650 (2003) |
| 2002 |
|---|
| 3 | | T. Alander,
S. Nurmi,
P. Heino,
Eero Ristolainen:
Impact of component placement in solder joint reliability.
Microelectronics Reliability 42(3): 399-406 (2002) |
| 1989 |
|---|
| 2 |  | P. Heino,
Jouko Suokas,
I. Karvonen:
Design of Safe and Reliable Process Systems by Knowledge Based Safety Analysis.
SCAI 1989: 415-429 |
| 1 | | Jouko Suokas,
P. Heino,
Roar A. Fjellheim,
R. Wennersten:
Knowledge Based Risk Management System for Process Industry.
SCAI 1989: 841-850 |
Data released under the ODC-BY 1.0 license — See also our legal information page