 | 2008 |
|---|
| 7 |       | Tino Heijmen:
Special Session 3 - Panel: SER in Automotive: what is the impact of the AEC Q100-G spec?
IOLTS 2008: 161-162 |
| 6 | | Tino Heijmen:
Soft-Error Vulnerability of Sub-100-nm Flip-Flops.
IOLTS 2008: 247-252 |
| 2007 |
|---|
| 5 | | Tino Heijmen:
Spread in Alpha-Particle-Induced Soft-Error Rate of 90-nm Embedded SRAMs.
IOLTS 2007: 131-136 |
| 2006 |
|---|
| 4 | | Tino Heijmen,
André Nieuwland:
Soft-Error Rate Testing of Deep-Submicron Integrated Circuits.
European Test Symposium 2006: 247-252 |
| 3 | | Tino Heijmen:
Soft Error Rates in Deep-Submicron CMOS Technologies.
IOLTS 2006: 271 |
| 2 | | Tino Heijmen,
Damien Giot,
Philippe Roche:
Factors That Impact the Critical Charge of Memory Elements.
IOLTS 2006: 57-62 |
| 2005 |
|---|
| 1 | | Tino Heijmen:
Analytical Semi-Empirical Model for SER Sensitivity Estimation of Deep-Submicron CMOS Circuits.
IOLTS 2005: 3-8 |
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