 | 2011 |
| 7 |  | Dionyz Pogany,
Sergey Bychikhin,
Michael Heer,
W. Mamanee,
Erich Gornik:
Application of transient interferometric mapping method for ESD and latch-up analysis.
Microelectronics Reliability 51(9-11): 1592-1596 (2011) |
| 2009 |
| 6 |  | Michael Heer,
Krzysztof Domanski,
Kai Esmark,
Ulrich Glaser,
Dionyz Pogany,
Erich Gornik,
Wolfgang Stadler:
Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology.
Microelectronics Reliability 49(12): 1455-1464 (2009) |
| 5 |  | G. Haberfehlner,
Sergey Bychikhin,
V. Dubec,
Michael Heer,
A. Podgaynaya,
M. Pfost,
Matthias Stecher,
Erich Gornik,
Dionyz Pogany:
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system.
Microelectronics Reliability 49(9-11): 1346-1351 (2009) |
| 2008 |
| 4 |  | Michael Heer,
P. Grombach,
A. Heid,
Dionyz Pogany:
Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applications.
Microelectronics Reliability 48(8-9): 1525-1528 (2008) |
| 2007 |
| 3 |  | Michael Heer,
Sergey Bychikhin,
W. Mamanee,
Dionyz Pogany,
A. Heid,
P. Grombach,
M. Klaussner,
W. Soppa,
B. Ramler:
Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices.
Microelectronics Reliability 47(9-11): 1450-1455 (2007) |
| 2006 |
| 2 |  | Michael Heer,
V. Dubec,
Sergey Bychikhin,
Dionyz Pogany,
Erich Gornik,
M. Frank,
A. Konrad,
J. Schulz:
Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up.
Microelectronics Reliability 46(9-11): 1591-1596 (2006) |
| 2005 |
| 1 |  | Michael Heer,
V. Dubec,
M. Blaho,
Sergey Bychikhin,
Dionyz Pogany,
Erich Gornik,
M. Denison,
Matthias Stecher,
G. Groos:
Automated setup for thermal imaging and electrical degradation study of power DMOS devices.
Microelectronics Reliability 45(9-11): 1688-1693 (2005) |