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Michael Heer Coauthor index pubzone.org

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DBLP keys2011
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDionyz Pogany, Sergey Bychikhin, Michael Heer, W. Mamanee, Erich Gornik: Application of transient interferometric mapping method for ESD and latch-up analysis. Microelectronics Reliability 51(9-11): 1592-1596 (2011)
2009
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMichael Heer, Krzysztof Domanski, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang Stadler: Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology. Microelectronics Reliability 49(12): 1455-1464 (2009)
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLG. Haberfehlner, Sergey Bychikhin, V. Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany: Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. Microelectronics Reliability 49(9-11): 1346-1351 (2009)
2008
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMichael Heer, P. Grombach, A. Heid, Dionyz Pogany: Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applications. Microelectronics Reliability 48(8-9): 1525-1528 (2008)
2007
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMichael Heer, Sergey Bychikhin, W. Mamanee, Dionyz Pogany, A. Heid, P. Grombach, M. Klaussner, W. Soppa, B. Ramler: Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices. Microelectronics Reliability 47(9-11): 1450-1455 (2007)
2006
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMichael Heer, V. Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Frank, A. Konrad, J. Schulz: Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up. Microelectronics Reliability 46(9-11): 1591-1596 (2006)
2005
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMichael Heer, V. Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Denison, Matthias Stecher, G. Groos: Automated setup for thermal imaging and electrical degradation study of power DMOS devices. Microelectronics Reliability 45(9-11): 1688-1693 (2005)

Coauthor Index

1M. Blaho [1]
2Sergey Bychikhin (Scrgey Bychikhin) [1] [2] [3] [5] [7]
3M. Denison [1]
4Krzysztof Domanski [6]
5V. Dubec [1] [2] [5]
6Kai Esmark [6]
7M. Frank [2]
8Ulrich Glaser [6]
9Erich Gornik [1] [2] [5] [6] [7]
10P. Grombach [3] [4]
11G. Groos [1]
12G. Haberfehlner [5]
13A. Heid [3] [4]
14M. Klaussner [3]
15A. Konrad [2]
16W. Mamanee [3] [7]
17M. Pfost [5]
18A. Podgaynaya [5]
19Dionyz Pogany [1] [2] [3] [4] [5] [6] [7]
20B. Ramler [3]
21J. Schulz [2]
22W. Soppa [3]
23Wolfgang Stadler [6]
24Matthias Stecher [1] [5]

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