Haldun Haznedar

	2006
3		Haldun Haznedar, Martin Gall, Vladimir Zolotov, Pon Sung Ku, Chanhee Oh, Rajendran Panda: Impact of stress-induced backflow on full-chip electromigration risk assessment. IEEE Trans. on CAD of Integrated Circuits and Systems 25(6): 1038-1046 (2006)
	2004
2		Chanhee Oh, Haldun Haznedar, Martin Gall, Amir Grinshpon, Vladimir Zolotov, Pon Sung Ku, Rajendran Panda: A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification. ISQED 2004: 232-237
	1998
1		N. S. Nagaraj, Frank Cano, Haldun Haznedar, Duane Young: A Practical Approach to Static Signal Electromigration Analysis. DAC 1998: 572-577

Coauthor Index

1	Frank Cano	[1]
2	Martin Gall	[2] [3]
3	Amir Grinshpon	[2]
4	Pon Sung Ku	[2] [3]
5	N. S. Nagaraj	[1]
6	Chanhee Oh	[2] [3]
7	Rajendran Panda	[2] [3]
8	Duane Young	[1]
9	Vladimir Zolotov	[2] [3]

Colors in the list of coauthors

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