Kazuo Hayashi

	2005
1		Takayuki Hisaka, Yasuki Aihara, Yoichi Nogami, Hajime Sasaki, Yasushi Uehara, Naohito Yoshida, Kazuo Hayashi: Degradation mechanisms of GaAs PHEMTs in high humidity conditions. Microelectronics Reliability 45(12): 1894-1900 (2005)

Coauthor Index

1	Yasuki Aihara	[1]
2	Takayuki Hisaka	[1]
3	Yoichi Nogami	[1]
4	Hajime Sasaki	[1]
5	Yasushi Uehara	[1]
6	Naohito Yoshida	[1]

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