K. Hayama

	2006
3		J. M. Rafí, Eddy Simoen, K. Hayama, Abdelkarim Mercha, F. Campabadal, H. Ohyama, Cor Claeys: Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs. Microelectronics Reliability 46(9-11): 1657-1663 (2006)
2		K. Hayama, K. Takakura, K. Shigaki, H. Ohyama, J. M. Rafí, Abdelkarim Mercha, Eddy Simoen, Cor Claeys: Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation. Microelectronics Reliability 46(9-11): 1731-1735 (2006)
	2005
1		K. Hayama, K. Takakura, H. Ohyama, S. Kuboyama, S. Matsuda, J. M. Rafí, Abdelkarim Mercha, Eddy Simoen, Cor Claeys: Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs. Microelectronics Reliability 45(9-11): 1376-1381 (2005)

Coauthor Index

1	F. Campabadal	[3]
2	Cor Claeys	[1] [2] [3]
3	S. Kuboyama	[1]
4	S. Matsuda	[1]
5	Abdelkarim Mercha	[1] [2] [3]
6	H. Ohyama	[1] [2] [3]
7	J. M. Rafí	[1] [2] [3]
8	K. Shigaki	[2]
9	Eddy Simoen	[1] [2] [3]
10	K. Takakura	[1] [2]

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