 | 2010 |
| 4 |  | Masashi Kamiyanagi,
Fumitaka Iga,
Shoji Ikeda,
Katsuya Miura,
Jun Hayakawa,
Haruhiro Hasegawa,
Takahiro Hanyu,
Hideo Ohno,
Tetsuo Endoh:
Transient Characteristic of Fabricated Magnetic Tunnel Junction (MTJ) Programmed with CMOS Circuit.
IEICE Transactions 93-C(5): 602-607 (2010) |
| 3 |  | Fumitaka Iga,
Masashi Kamiyanagi,
Shoji Ikeda,
Katsuya Miura,
Jun Hayakawa,
Haruhiro Hasegawa,
Takahiro Hanyu,
Hideo Ohno,
Tetsuo Endoh:
Study of the DC Performance of Fabricated Magnetic Tunnel Junction Integrated on Back-End Metal Line of CMOS Circuits.
IEICE Transactions 93-C(5): 608-613 (2010) |
| 2 |  | Riichiro Takemura,
Takayuki Kawahara,
Katsuya Miura,
Hiroyuki Yamamoto,
Jun Hayakawa,
Nozomu Matsuzaki,
Kazuo Ono,
Michihiko Yamanouchi,
Kenchi Ito,
Hiromasa Takahashi,
Shoji Ikeda,
Haruhiro Hasegawa,
Hideyuki Matsuoka,
Hideo Ohno:
A 32-Mb SPRAM With 2T1R Memory Cell, Localized Bi-Directional Write Driver and `1'/`0' Dual-Array Equalized Reference Scheme.
J. Solid-State Circuits 45(4): 869-879 (2010) |
| 2009 |
| 1 |  | Shoun Matsunaga,
Jun Hayakawa,
Shoji Ikeda,
Katsuya Miura,
Tetsuo Endoh,
Hideo Ohno,
Takahiro Hanyu:
MTJ-based nonvolatile logic-in-memory circuit, future prospects and issues.
DATE 2009: 433-435 |