N. A. Hastas

	2011
4		N. A. Hastas, N. Arpatzanis, C. A. Dimitriadis, Julien Brochet, Francois Templier, G. Kamarinos: Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors. Microelectronics Reliability 51(3): 556-559 (2011)
	2005
3		N. A. Hastas, N. Archontas, C. A. Dimitriadis, G. Kamarinos, T. Nikolaidis, N. Georgoulas, A. Thanailakis: Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors. Microelectronics Reliability 45(2): 341-348 (2005)
	2003
2		N. A. Hastas, C. A. Dimitriadis, J. Brini, G. Kamarinos, V. K. Gueorguiev, S. Kaschieva: Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistors. Microelectronics Reliability 43(1): 57-60 (2003)
1		N. A. Hastas, C. A. Dimitriadis, F. V. Farmakis, G. Kamarinos: Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistors. Microelectronics Reliability 43(4): 671-674 (2003)

Coauthor Index

1	N. Archontas	[3]
2	N. Arpatzanis	[4]
3	J. Brini	[2]
4	Julien Brochet	[4]
5	C. A. Dimitriadis (Charalambos A. Dimitriadis)	[1] [2] [3] [4]
6	F. V. Farmakis	[1]
7	N. Georgoulas	[3]
8	V. K. Gueorguiev	[2]
9	G. Kamarinos	[1] [2] [3] [4]
10	S. Kaschieva	[2]
11	T. Nikolaidis	[3]
12	Francois Templier	[4]
13	A. Thanailakis	[3]

Last update Thu May 31 18:55:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page