L. Hasse

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2001

1 B. K. Jones, C. N. Graham, A. Konczakowska, L. Hasse: The coherence of the gate and drain noise in stressed AlGaAs-InAlGaAs PHEMTs. Microelectronics Reliability 41(1): 87-97 (2001)

	2001
1		B. K. Jones, C. N. Graham, A. Konczakowska, L. Hasse: The coherence of the gate and drain noise in stressed AlGaAs-InAlGaAs PHEMTs. Microelectronics Reliability 41(1): 87-97 (2001)

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