Hamidreza Hashempour

	2011
25		Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing: Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. DATE 2011: 371-376
24		Nivesh Rai, Hamidreza Hashempour, Yizi Xing, Bram Kruseman, Said Hamdioui: A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices. DFT 2011: 139-145
23		Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing: Defect Oriented Testing for analog/mixed-signal devices. ITC 2011: 1-10
	2010
22		Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger: Defect-oriented cell-internal testing. ITC 2010: 285-294
	2009
21		Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson: Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC 2009: 1-10
20		Faizal Karim, Marco Ottavi, Hamidreza Hashempour, Vamsi Vankamamidi, Konrad Walus, André Ivanov, Fabrizio Lombardi: Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits. J. Electronic Testing 25(1): 55-66 (2009)
	2008
19		Hamidreza Hashempour, Fabrizio Lombardi: Device Model for Ballistic CNFETs Using the First Conducting Band. IEEE Design & Test of Computers 25(2): 178-186 (2008)
18		Hamidreza Hashempour, Fabrizio Lombardi: Evaluation and Analysis of Heuristic Techniques for Vector Ordering of VLSI Test Sets. IEEE T. Instrumentation and Measurement 57(9): 1998-2004 (2008)
	2007
17		Hamidreza Hashempour, Fabrizio Lombardi: Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs. DATE 2007: 841-846
16		Hamidreza Hashempour, Fabrizio Lombardi, Warren Necoechea, R. Mehta, T. Alton: An Integrated Environment for Design Verification of ATE Systems. IEEE T. Instrumentation and Measurement 56(5): 1734-1743 (2007)
	2006
15		Hamidreza Hashempour, Fabrizio Lombardi: A Novel Methodology for Functional Test Data Compression. DFT 2006: 128-135
	2005
14		Hamidreza Hashempour, Fabrizio Lombardi: Two dimensional reordering of functional test data for compression by ATE. ACM Great Lakes Symposium on VLSI 2005: 188-192
13		Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi: Enhancing error resilience for reliable compression of VLSI test data. ACM Great Lakes Symposium on VLSI 2005: 371-376
12		Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi: Evaluation of Error-Resilience for Reliable Compression of Test Data. DATE 2005: 1284-1289
11		Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi: Evaluation, analysis, and enhancement of error resilience for reliable compression of VLSI test data. IEEE T. Instrumentation and Measurement 54(5): 1761-1769 (2005)
10		Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi: Analysis and evaluation of multisite testing for VLSI. IEEE T. Instrumentation and Measurement 54(5): 1770-1778 (2005)
9		Hamidreza Hashempour, Fabrizio Lombardi: Application of Arithmetic Coding to Compression of VLSI Test Data. IEEE Trans. Computers 54(9): 1166-1177 (2005)
	2004
8		Hamidreza Hashempour, Fabrizio Lombardi: Evaluation of heuristic techniques for test vector ordering. ACM Great Lakes Symposium on VLSI 2004: 96-99
7		Hamidreza Hashempour, Fabrizio Lombardi: Compression of VLSI Test Data by Arithmetic Coding. DFT 2004: 150-157
6		Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi: Error-Resilient Test Data Compression Using Tunstall Codes. DFT 2004: 316-323
5		Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi: Analysis and measurement of fault coverage in a combined ATE and BIST environment. IEEE T. Instrumentation and Measurement 53(2): 300-307 (2004)
	2003
4		Hamidreza Hashempour, Fabrizio Lombardi: ATE-Amenable Test Data Compression with No Cyclic Scan. DFT 2003: 151-158
3		Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi: Hybrid Multisite Testing at Manufacturing. ITC 2003: 927-936
	2002
2		Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi: Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. DFT 2002: 186-194
1		Hamidreza Hashempour, Yong-Bin Kim, Nohpill Park: A Test-Vector Generation Methodology for Crosstalk Noise Faults. DFT 2002: 40-50

Coauthor Index

1	Dan Adolfsson	[21]
2	T. Alton	[16]
3	Maikel van Beurden	[23] [25]
4	Jos Dohmen	[23] [25]
5	Stefan Eichenberger	[21] [22]
6	Andreas Glowatz	[21] [22]
7	Said Hamdioui	[24]
8	Friedrich Hapke	[21] [22]
9	Camelia Hora	[21] [23] [25]
10	André Ivanov	[20]
11	Faizal Karim	[20]
12	Farzin Karimi	[3]
13	Yong-Bin Kim	[1]
14	Rene Krenz-Baath	[21] [22]
15	Bram Kruseman	[23] [24] [25]
16	Fabrizio Lombardi	[2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20]
17	R. Mehta	[16]
18	Fred J. Meyer	[2] [3] [5] [10]
19	Warren Necoechea	[16]
20	Marco Ottavi	[20]
21	Nohpill Park	[1]
22	Nivesh Rai	[24]
23	Wilfried Redemund	[22]
24	Luca Schiano	[6] [11] [12] [13]
25	Jürgen Schlöffel	[21] [22]
26	Bratislav Tasic	[23] [25]
27	Vamsi Vankamamidi	[20]
28	Konrad Walus	[20]
29	Michael Wittke	[22]
30	Yizi Xing	[23] [24] [25]

Colors in the list of coauthors

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